07 | Keysight | N5393D PCI Express® 3.0 (Gen3) Software for Infiniium Oscilloscopes - Data Sheet
PCI Express 3.0
The N5393D includes support for testing
PCI Express 3.0 devices. The tests
supported include new jitter, voltage,
de-emphasis, preshoot, pseudo S21 loss
and others defined by the PCI Express
3.0 BASE specification. In addition, with
the addition of the optional InfiniiSim
Waveform Transformation Toolset, the
N5393D also integrates de-embedding
of test channel and cable losses with
user-supplied S-parameters for fixtures
and connectors. De-embedding is used to
recover jitter losses due to the attenuation
of high frequency elements caused by the
test channel.
Select PCI Express
Transmitter tests to test
your new PCIe 3.0 device.
Figure 4. PCI Express 3.0 transmitter tests.
Figure 5. The N5393D integrates de-embedding capability when coupled with the optional
InfiniiSim waveform transformation toolset.
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