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86116C-025 参数 Datasheet PDF下载

86116C-025图片预览
型号: 86116C-025
PDF下载: 下载PDF文件 查看货源
内容描述: [Wide-Bandwidth Oscilloscope Mainframe and Modules]
分类和应用:
文件页数/大小: 35 页 / 3883 K
品牌: KEYSIGHT [ Keysight Technologies ]
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26 | Keysight | Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Data Sheet  
Measurements (Continued)  
Option 500 productivity package including TDEC  
– Time at max  
– Time at min  
– Time at amplitude  
Option 500 enables Rapid Eye acquisition and TDEC (transmitter  
dispersion and eye closure) measurements. Rapid Eye achieves  
two significant benefits. First, unlike conventional sampling  
and data display, when an eye mask test is performed, every  
acquired sample will be compared to the mask, as the central  
eye is composed of all acquired samples. Effective throughput is  
improved at least 60%. Second, incomplete eye diagram displays  
that can occur when triggering at sub-rates are eliminated. TDEC  
is a complex eye diagram measurement required for new high  
data rate standards deployed over multimode fiber. It is easily  
and quickly achieved with the automated TDEC measurement.  
(IEEE 802.3bm and T11 FC-PI-6P require a specific TDEC channel  
bandwidth, achieved with 86105D/86115D-Option 168.)  
– Limit lines  
– Time at edge  
Additional capabilities  
Standard functions  
– Standard functions are available through pull down menus  
and soft keys, and some functions are also accessible  
through the front panel knobs.  
Markers  
– Two vertical and two horizontal (user-selectable)  
Option 401 advanced EYE analysis  
Limit tests  
– Acquisition limits  
– Limit test “Run Until” conditions — Off, # of Waveforms, # of  
Samples  
– Report action on completion — Save waveform to memory,  
save screen image  
– Jitter measurements  
Total jitter (TJ), random jitter (RJ), deterministic jitter (DJ), J2  
jitter (J2), J5 jitter (J5), J9 jitter (J9)  
– Amplitude measurements  
Total interference (TI), random noise (RN), deterministic  
interference (DI), eye opening  
– Measurement limit test  
– Mask test  
Pass/fail status, BER limit  
– Specify number of failures to stop limit test  
– When to fail selected measurement — Inside limits, outside  
limits, always fail, never fail  
– Report action on failure — Save waveform to memory, save  
screen image, save summary  
Option SIM InfiniiSim-DCA  
2-port de-embedding and embedding; 4-port de-embedding and  
embedding; add simulated random jitter and noise  
– Mask limit test  
– Specify number of failed mask test samples  
– Report action on failure — Save waveform to memory, save  
screen image, save summary  
Option 9FP PAM-N analysis software  
– Electrical and optical signals  
– Eye width, eye height, eye skew  
– Level amplitude, level noise, level skew  
– Linearity measurements  
Limit lines  
– With the limit line editor, you can modify an existing limit line  
or create a new limit line from a current waveform or manual  
data entry.  
– Limit lines are displayed boundaries used for pass/fail testing  
in oscilloscope and TDR/TDT instrument modes, and they  
are similar to masks in Eye/Mask mode.  
– TDECQ, Outer OMA, Outer ER  
Option TFP IEEE TDEFCQ Analysis software  
– TDECQ, Outer OMA, Outer ER  
– Any data point that occurs above an upper limit line or below  
a lower limit line causes a failed condition. A failed portion of  
a waveform that is beyond the limit line boundary is displayed  
in red.  
TDR/TDT mode (requires TDR module)  
Some also usable within measurement regions:  
Prior to average add:  
– Time domain responses available in volts, percent reflection  
and ohms (where applicable)  
– X-axis in time or distance  
– Average  
Waveform autoscaling  
Autoscaling provides quick horizontal and vertical scaling of both  
pulse and eye-diagram (RZ and NRZ) waveforms.  
– Min  
– Max  
– Amplitude at time  
– Excess capacitance  
– Excess inductance  
– Rise time  
– Fall time  
– Delta time  
Gated triggering  
Trigger gating port allows easy external control of data  
acquisition for circulating loop or burst-data experiments. Use  
TTL-compatible signals to control when the instrument does
does not acquire data.  
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