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86116C-025 参数 Datasheet PDF下载

86116C-025图片预览
型号: 86116C-025
PDF下载: 下载PDF文件 查看货源
内容描述: [Wide-Bandwidth Oscilloscope Mainframe and Modules]
分类和应用:
文件页数/大小: 35 页 / 3883 K
品牌: KEYSIGHT [ Keysight Technologies ]
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24 | Keysight | Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Data Sheet  
Software Applications  
86100D-200 enhanced jitter analysis  
86100D-SIM InfiniiSim-DCA  
Option 200 provides extensive and accurate jitter decomposition,  
At higher data rates, the effect of measurement fixtures and  
which is increasingly important as data rates increase and margins channels is prominent and can be accounted for through the  
reduce. Quickly customize your view of many parameters and take de-embedding capabilities within Option SIM. You may also view  
advantage of advanced features such as jitter spectrum analysis.  
measurements on live and simulated signals, allowing you to  
compare design intent to actual performance.  
86100D-201 advanced waveform analysis  
N1012A OIF CEI compliance and debug application  
Take advantage of powerful features in Option 201 to generate  
much deeper waveform files, integrate MATLAB analysis, and use  
equalizers (CTLE, LFE, DFE), User Operators and User Defined  
Measurements.  
The N1012A application lets you fully characterize the ~120 trans-  
mitter test parameters (including 28G-VSR), reducing your test time  
from hours to minutes. Included are return loss tests and several  
utilities to improve your test productivity. Debug mode enables you  
to characterize your devices well beyond the parameters prescribed  
in the implementation agreements.  
86100D-202enhancedimpedanceandS-parameter  
Option 202 works in TDR mode and provides live S-parameter  
responses, including magnitude (return loss, insertion loss, etc.),  
phase and group delay. Single-ended, differential and mixed-  
mode responses are available simultaneously. Also enables quick  
and easy saving of measurement results in Touchstone files (.s2p,  
.s4p, etc.).  
N1014A SFF-8431 compliance and debug  
application  
The N1014A application lets you fully characterize ~70 test  
parameters including all transmitter tests for host, module and host  
copper and all test signals for receiver testing. Return loss tests and  
utilities are also included.  
86100D-300 amplitude analysis/RIN/Q-factor  
Extend the many capabilities from jitter mode into the amplitude  
domain and see the decomposition of the amplitude into several  
factors. Option 300 also reports relative intensity noise (RIN) and  
Q-factor.  
N1019A user-defined application  
You may create your own test application or suite of tests using the  
DCA-X and other instruments. Quickly and intuitively create groups  
of tests, test descriptions, user prompts and test limits. Use concise  
HTML reports to share your multiple test results with your users.  
86100D-400 PLL and jitter spectrum  
Option 400 quickly characterizes key parameters of phase-locked  
loops and provides the jitter spectrum of your signal including  
spread spectrum clocks. Control of the jitter source and receiver  
is integrated to ensure fast results.  
N1081-4A IEEE802.3 Ethernet applications  
The extensive requirements for IEEE802.3-2012, 802.3bj and  
802.3bm are covered in these four applications, which comprise  
> 400 tests. Characterize your device for one, four or ten lanes, and  
analyze trends over time/temperature and between devices.  
86100D-401 advanced EYE analysis  
For device testing with long patterns and to obtain BER-contour  
mask testing, Option 401 integrates with the classic or FlexDCA  
interfaces to decompose the jitter and amplitude interference  
measurements into the key parameters. When using the  
embedded capability within FlexDCA or the included automation  
application, you may characterize jitter on simultaneous multiple  
lanes and obtain concise and visual results.  
N1085A PAM4 Ethernet and OIF-CEI  
Measurement Application  
The N1085A software application covers PAM-4 transmitter  
measurements outlined in IEEE P802.3bs and four OIF-CEI-4.0  
(56G) clauses.  
86100D-9FP PAM-N analysis software  
Accurately and quickly analyze Pulse Amplitude Modulation  
(PAM) signals as described in IEEE 802.3bj Clause 94 and  
developing standards such as OIF-CEI-56G and IEEE 400G.  
86100D-BFP Automatic Fixture Removal (AFR)  
When measuring physical layer devices with non-coaxial interfaces,  
test fixtures or probes are often used to connect the device under  
test (DUT) to the measurement equipment. For accurate measure-  
ments of the DUT, the fixtures or probes need to be characterized  
and their effects removed from the composite measurement of  
the DUT plus test fixture or probe combination. This option adds  
the Automatic Fixture Removal (AFR) capability from Keysight’s  
powerful N1930B Physical Layer Test System (PLTS) software to  
help you characterize a fixture or probe with non-coaxial interfaces.  
Fixtures and probes to be characterized can be single-ended or  
differential.  
86100D-TFP IEEE TDECQ Analysis software  
A lower cost subset of option 9FP capabilities that targets optical  
Transmitter production test applications  
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