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86115D-104 参数 Datasheet PDF下载

86115D-104图片预览
型号: 86115D-104
PDF下载: 下载PDF文件 查看货源
内容描述: [Wide-Bandwidth Oscilloscope Mainframe and Modules]
分类和应用:
文件页数/大小: 37 页 / 3203 K
品牌: KEYSIGHT [ Keysight Technologies ]
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28 | Keysight | Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Data Sheet  
Measurements (Continued)  
Option 500 productivity package including TDEC  
Time at max  
Time at min  
Time at amplitude  
Option 500 enables Rapid Eye acquisition and TDEC (transmitter  
dispersion and eye closure) measurements. Rapid Eye achieves  
two significant benefits. First, unlike conventional sampling  
and data display, when an eye mask test is performed, every  
acquired sample will be compared to the mask, as the central  
eye is composed of all acquired samples. Effective throughput is  
improved at least 60%. Second, incomplete eye diagram displays  
that can occur when triggering at sub-rates are eliminated. TDEC  
is a complex eye diagram measurement required for new high  
data rate standards deployed over multimode fiber. It is easily  
and quickly achieved with the automated TDEC measurement.  
(IEEE 802.3bm and T11 FC-PI-6P require a specific TDEC channel  
bandwidth, achieved with 86105D/86115D-Option 168.)  
Limit lines  
Time at edge  
Additional capabilities  
Standard functions  
Standard functions are available through pull down menus  
and soft keys, and some functions are also accessible  
through the front panel knobs.  
Markers  
Two vertical and two horizontal (user-selectable)  
Option 401 advanced EYE analysis  
Limit tests  
Acquisition limits  
Limit test “Run Until” conditions — Off, # of Waveforms, # of  
Samples  
Report action on completion — Save waveform to memory,  
save screen image  
Jitter measurements  
Total jitter (TJ), random jitter (RJ), deterministic jitter (DJ), J2  
jitter (J2), J5 jitter (J5), J9 jitter (J9)  
Amplitude measurements  
Total interference (TI), random noise (RN), deterministic  
interference (DI), eye opening  
Measurement limit test  
Mask test  
Pass/fail status, BER limit  
Specify number of failures to stop limit test  
When to fail selected measurement — Inside limits, outside  
limits, always fail, never fail  
Report action on failure — Save waveform to memory, save  
screen image, save summary  
Option SIM InfiniiSim-DCA  
2-port de-embedding and embedding; 4-port de-embedding and  
embedding; add simulated random jitter and noise  
Mask limit test  
Specify number of failed mask test samples  
Report action on failure — Save waveform to memory, save  
screen image, save summary  
Option 9FP PAM-N analysis software  
Electrical and optical signals  
Eye width, eye height, eye skew  
Level amplitude, level noise, level skew  
Linearity measurements  
Limit lines  
With the limit line editor, you can modify an existing limit line  
or create a new limit line from a current waveform or manual  
data entry.  
TDR/TDT mode (requires TDR module)  
Limit lines are displayed boundaries used for pass/fail testing  
in oscilloscope and TDR/TDT instrument modes, and they  
are similar to masks in Eye/Mask mode.  
Any data point that occurs above an upper limit line or below  
a lower limit line causes a failed condition. A failed portion of  
a waveform that is beyond the limit line boundary is displayed  
in red.  
Some also usable within measurement regions:  
Prior to average add:  
Time domain responses available in volts, percent reflection  
and ohms (where applicable)  
X-axis in time or distance  
Average  
– Min  
Max  
Waveform autoscaling  
Autoscaling provides quick horizontal and vertical scaling of both  
pulse and eye-diagram (RZ and NRZ) waveforms.  
Amplitude at time  
Excess capacitance  
Excess inductance  
Rise time  
Fall time  
Delta time  
Gated triggering  
Trigger gating port allows easy external control of data  
acquisition for circulating loop or burst-data experiments. Use  
TTL-compatible signals to control when the instrument does and  
does not acquire data.  
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