27 | Keysight | Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Data Sheet
Measurements
The 86100D DCA-X features two user interfaces for optimum
Option 201 advanced waveform analysis
ease-of-use. It includes the classic DCA interface for complete
backwards compatibility with earlier DCA mainframes. It
also includes the new FlexDCA interface that provides new
measurements and powerful analysis capability in a fully
customizable application.
– Measurements
Deep memory pattern waveform, user-defined
measurements through MATLAB interface
– Data displays
Equalized waveform
The following measurements are available from the tool bar, as
well as the pull down menus. The available measurements depend
on the DCA-X operating mode.
Option 202 enhanced impedence and
S-parameters
– Markers and delta markers on live frequency domain
responses such as S-parameter magnitude, phase and group
delay
Oscilloscope mode
– Time
Rise time, fall time, jitter RMS, jitter p-p, period, frequency,
+ pulse width, – pulse wWidth, duty cycle, delta time, [Tmax,
Tmin, Tedge—remote commands only]
– Amplitude
Overshoot, average power, V amptd, V p-p, V rms, V top,
V base, V max, V min, V avg, OMA (optical modulation
amplitude)
Option 300 amplitude analysis/RIN/Q-factor
(requires Option 200)
– Measurements
Total interference (TI), deterministic interference (dual-dirac
model, DI), random noise (RN), periodic interference (PI), and
Inter-symbol interference (ISI), RIN (dBm or dB/Hz), Q-factor
– Data displays
Eye/mask mode
TI histogram, RN/PI histogram, ISI histogram
– NRZ eye measurements
Extinction ratio, jitter RMS, jitter p-p, average power,
crossing percentage, rise time, fall time, one level, zero Level,
eye height, eye width, signal to noise, duty cycle distortion,
bit rate, eye amplitude
Option 400 PLL and jitter spectrum measurement
software
– Jitter spectrum/phase noise measurements integrated jitter:
Total jitter (TJ), random jitter (RJ), deterministic jitter (DJ);
DJ amplitude/frequency, jitter spectrum graph, jitter versus
time graph, frequency versus time graph, jitter histogram,
post processed jitter measurements, phase noise graph
dBc/Hz versus frequency
– RZ eye measurements
Extinction ratio, jitter RMS, Jitter p-p, average power,
rise time, fall time, one level, zero level, eye height, eye
amplitude, opening factor, eye width, pulse width, signal to
noise, duty cycle, bit rate, contrast ratio
– Phase locked loop (PLL) measurements PLL bandwidth,
PLL peaking, data rate, jitter transfer function (JTF) graph,
observed jitter transfer (OJTF) graph, JTF model.
Mask test
– Open mask, start mask test, exit mask test, filter, mask test
margins, mask margin to a hit ratio, mask test scaling, create
NRZ mask
Option 401 advanced eye analysis
– * Jitter analysis on long patterns
Option 200 enhanced jitter analysis software
FlexDCA version: Total jitter (TJ), deterministic jitter (DJ), random
jitter (RJ), J2, J5, J9. Jitter can be measured on long patterns
such as PRBS23, PRBS31, live traffic.
– Measurements
Total jitter (TJ), random jitter (RJ), deterministic jitter (DJ),
periodic jitter (PJ), data dependent jitter (DDJ), duty cycle
distortion (DCD), intersymbol interference (ISI), sub-rate jitter
(SRJ), asynchronous periodic jitter frequencies, subrate jitter
components
Microsoft Excel version: All of the above, plus BER contour mask
testing.
– FlexDCA adds the following measurements:
Data dependent pulse width shrinkage (DDPWS),
uncorrelated jitter (UJ), J2, J9
– Data displays
TJ histogram, RJ/PJ histogram, DDJ histogram, composite
histogram, DDJ versus bit position, bathtub curve (log or Q
scale)
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