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86115D-104 参数 Datasheet PDF下载

86115D-104图片预览
型号: 86115D-104
PDF下载: 下载PDF文件 查看货源
内容描述: [Wide-Bandwidth Oscilloscope Mainframe and Modules]
分类和应用:
文件页数/大小: 37 页 / 3203 K
品牌: KEYSIGHT [ Keysight Technologies ]
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27 | Keysight | Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Data Sheet  
Measurements  
The 86100D DCA-X features two user interfaces for optimum  
Option 201 advanced waveform analysis  
ease-of-use. It includes the classic DCA interface for complete  
backwards compatibility with earlier DCA mainframes. It  
also includes the new FlexDCA interface that provides new  
measurements and powerful analysis capability in a fully  
customizable application.  
Measurements  
Deep memory pattern waveform, user-defined  
measurements through MATLAB interface  
Data displays  
Equalized waveform  
The following measurements are available from the tool bar, as  
well as the pull down menus. The available measurements depend  
on the DCA-X operating mode.  
Option 202 enhanced impedence and  
S-parameters  
Markers and delta markers on live frequency domain  
responses such as S-parameter magnitude, phase and group  
delay  
Oscilloscope mode  
Time  
Rise time, fall time, jitter RMS, jitter p-p, period, frequency,  
+ pulse width, – pulse wWidth, duty cycle, delta time, [Tmax,  
Tmin, Tedge—remote commands only]  
Amplitude  
Overshoot, average power, V amptd, V p-p, V rms, V top,  
V base, V max, V min, V avg, OMA (optical modulation  
amplitude)  
Option 300 amplitude analysis/RIN/Q-factor  
(requires Option 200)  
Measurements  
Total interference (TI), deterministic interference (dual-dirac  
model, DI), random noise (RN), periodic interference (PI), and  
Inter-symbol interference (ISI), RIN (dBm or dB/Hz), Q-factor  
Data displays  
Eye/mask mode  
TI histogram, RN/PI histogram, ISI histogram  
NRZ eye measurements  
Extinction ratio, jitter RMS, jitter p-p, average power,  
crossing percentage, rise time, fall time, one level, zero Level,  
eye height, eye width, signal to noise, duty cycle distortion,  
bit rate, eye amplitude  
Option 400 PLL and jitter spectrum measurement  
software  
Jitter spectrum/phase noise measurements integrated jitter:  
Total jitter (TJ), random jitter (RJ), deterministic jitter (DJ);  
DJ amplitude/frequency, jitter spectrum graph, jitter versus  
time graph, frequency versus time graph, jitter histogram,  
post processed jitter measurements, phase noise graph  
dBc/Hz versus frequency  
RZ eye measurements  
Extinction ratio, jitter RMS, Jitter p-p, average power,  
rise time, fall time, one level, zero level, eye height, eye  
amplitude, opening factor, eye width, pulse width, signal to  
noise, duty cycle, bit rate, contrast ratio  
Phase locked loop (PLL) measurements PLL bandwidth,  
PLL peaking, data rate, jitter transfer function (JTF) graph,  
observed jitter transfer (OJTF) graph, JTF model.  
Mask test  
Open mask, start mask test, exit mask test, filter, mask test  
margins, mask margin to a hit ratio, mask test scaling, create  
NRZ mask  
Option 401 advanced eye analysis  
* Jitter analysis on long patterns  
Option 200 enhanced jitter analysis software  
FlexDCA version: Total jitter (TJ), deterministic jitter (DJ), random  
jitter (RJ), J2, J5, J9. Jitter can be measured on long patterns  
such as PRBS23, PRBS31, live traffic.  
Measurements  
Total jitter (TJ), random jitter (RJ), deterministic jitter (DJ),  
periodic jitter (PJ), data dependent jitter (DDJ), duty cycle  
distortion (DCD), intersymbol interference (ISI), sub-rate jitter  
(SRJ), asynchronous periodic jitter frequencies, subrate jitter  
components  
Microsoft Excel version: All of the above, plus BER contour mask  
testing.  
FlexDCA adds the following measurements:  
Data dependent pulse width shrinkage (DDPWS),  
uncorrelated jitter (UJ), J2, J9  
Data displays  
TJ histogram, RJ/PJ histogram, DDJ histogram, composite  
histogram, DDJ versus bit position, bathtub curve (log or Q  
scale)  
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