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IRGPC30S 参数 Datasheet PDF下载

IRGPC30S图片预览
型号: IRGPC30S
PDF下载: 下载PDF文件 查看货源
内容描述: FIT率/等效器件小时 [Fit Rate / Equivalent Device Hours]
分类和应用: 晶体晶体管双极性晶体管局域网
文件页数/大小: 35 页 / 98 K
品牌: IRF [ INTERNATIONAL RECTIFIER ]
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Using IGBT Reliability Information
Reliability is the probability that a semiconductor device will perform its
specified function in a given environment for a specified period of time.
Reliability is quality over time & environmental conditions.
Reliability can be defined as a probability of failure-free performance of a
required function, under a specified environment, for a given period of time.
The reliability of semiconductors has been extensively studied and the data
generated from these works is widely used in industry to estimate the
probabilities of system lifetimes. The reliability of a specific semiconductor
device is unique to the technology process used in fabrication and to the
external stress applied to the device.
In order to understand the reliability of specific product like the IGBT it is
useful to determine the failure rate associated with each environmental stress
that IGBT's encounter.
The values reported in this report are at a 60% upper confidence limit and the
equivalent device hours at state of working temperature of 90°C. It has been
shown that the failure rate of semiconductors in general. when followed for a
long period of time, exhibits what has been called a "Bathtub Curve" when
plotted against time for a given set of environmental conditions.
Classic Bathtub Curve for failure rate of solid state devices
λ
(t)
Infant
Failures
Wearout
Failures
Log Failure
Random Failures
Log Time
t
IGBT / CoPack
Quarterly Reliability Report
Page 6 of 35