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IRGPC30S 参数 Datasheet PDF下载

IRGPC30S图片预览
型号: IRGPC30S
PDF下载: 下载PDF文件 查看货源
内容描述: FIT率/等效器件小时 [Fit Rate / Equivalent Device Hours]
分类和应用: 晶体晶体管双极性晶体管局域网
文件页数/大小: 35 页 / 98 K
品牌: IRF [ INTERNATIONAL RECTIFIER ]
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Fit Rate / Equivalent Device Hours
Traditionally, reliability results have been presented in terms of Mean-Time-To-Failure
or Median-Time-To-Failure. While these results have their value, they do not
necessarily tell the designer what he most needs to know. For example, the Median-
Time-To-Failure tells the engineer how long it will take for half a particular lot of
devices to fail. Clearly no designer wishes to have a 50% failure rate within a
reasonable equipment lifetime. Of greater interest, therefore, is the time to failure of a
much smaller percentage of devices say 1% or 0.1%. For example, in a given
application one failure per hundred units over five years is an acceptable failure rate
for the equipment, the designer knows that time to accumulate 1% failure of that
components per unit, then no more than 0.1% of the components may fail in five
years. Therefore, the IGBT / CoPack reliability or operating-life data is presented in
terms of the time it will take to produce a prescribed number of failures under given
operating conditions.
To obtain a perspective of failure rate from an example, let us assume that an
electronic system contains 1,000 semiconductor devices, and that it can tolerate 1%
system failures per month. The equation for the device failure is:
λ
= Proportion allowed system failures
Time period
In the case of the example,
λ
=
0.01 Failures
720 Hours
X
1
No. of devices
X
10
9
=
FITS
X
1
1000 Devices
=
10
9
=
14 FITS
or 14 FITs or 14 failures per 10
9
devices hours.
IGBT / CoPack
Quarterly Reliability Report
Page 5 of 35