DG408, DG409
Test Circuits and Waveforms
+15V
+2.4V
EN
A
0
LOGIC
INPUT
50Ω
A
1
A
2
V+
S
1
8
+15V
+2.4V
±10V
10V
SWITCH
OUTPUT
V
O
35pF
LOGIC
INPUT
50Ω
±
EN
V+
S
1B
±10V
SWITCH
OUTPUT
V
O
35pF
GND
V-
D
300Ω
A
1
GND
V-
D
B
300Ω
-
15V
FIGURE 1A. DG408 TEST CIRCUIT
-
15V
FIGURE 1B. DG409 TEST CIRCUIT
LOGIC
INPUT
3V
50%
0V
V
S1
S
1
ON
50%
t
r
< 20ns
t
f
< 20ns
SWITCH
OUTPUT
V
O
0.8 V
S1
0.8 V
S8
t
TRANS
S
8
ON
t
TRANS
0V
V
S8
FIGURE 1C. MEASUREMENT POINTS
FIGURE 1. TRANSITION TIME
+15V
+15V
A
0
LOGIC
INPUT
A
1
V
IN
50Ω
A
2
V+
DG408
S
2
- S
8
V-
D
S
1
-
5V
SWITCH
OUTPUT
V
O
300Ω
35pF
LOGIC
INPUT
V
IN
50Ω
EN GND
V+
S
1B
DG409
A
1
S
1A
- S
4A
S
2B -
S
4B,
D
A
EN GND V- D
B
A
0
300Ω
-
15V
FIGURE 2A. DG408 TEST CIRCUIT
-
15V
FIGURE 2B. DG409 TEST CIRCUIT
LOGIC
INPUT
V
IN
3V
50%
0V
t
ON(EN)
0V
50%
t
r
< 20ns
t
f
< 20ns
SWITCH
OUTPUT
V
O
V
O
0.9 V
O
t
OFF(EN)
FIGURE 2C. MEASUREMENT POINTS
FIGURE 2. ENABLE SWITCHING TIMES
6
±
S
2
- S
7
DG408 S
S
1A
- S
4A,
D
A
A
0
DG409 S
4B
10V
-
5V
SWITCH
OUTPUT
V
o
35pF
FN3283.8
June 13, 2006
INTERSIL [ INTERSIL CORPORATION ]
