Specifications CD4070BMS, CD4077BMS
TABLE 6. APPLICABLE SUBGROUPS (Continued)
MIL-STD-883
CONFORMANCE GROUP
PDA (Note 1)
METHOD
100% 5004
100% 5004
Sample 5005
Sample 5005
Sample 5005
Sample 5005
GROUP A SUBGROUPS
READ AND RECORD
1, 7, 9, Deltas
Final Test
2, 3, 8A, 8B, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 7, 9
Group A
Group B
Subgroup B-5
Subgroup B-6
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
Group D
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
TEST
READ AND RECORD
MIL-STD-883
METHOD
CONFORMANCE GROUPS
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
POST-IRRAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
Static Burn-In 1
Note 1
3, 4, 10, 11
1, 2, 5-9, 12, 13
14
Static Burn-In 2
Note 1
3, 4, 10, 11
-
7
7
7
1, 2, 5, 6, 8,
9, 12-14
Dynamic Burn-
In Note 1
14
3, 4, 10, 11
1, 5, 8, 12
2, 6, 9, 13
Irradiation
Note 2
3, 4, 10, 11
1, 2, 5, 6, 8,
9, 12-14
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
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