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5962R9675502VJC 参数 Datasheet PDF下载

5962R9675502VJC图片预览
型号: 5962R9675502VJC
PDF下载: 下载PDF文件 查看货源
内容描述: 抗辐射高速,单片式数位类比转换器 [Radiation Hardened High Speed, Monolithic Digital-to-Analog Converter]
分类和应用: 转换器
文件页数/大小: 9 页 / 432 K
品牌: INTERSIL [ INTERSIL CORPORATION ]
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HS-565BRH, HS-565BEH
Settling Time
This is a challenging measurement, in which the result depends
on the method chosen, the precision and quality of test
equipment and the operating configuration of the DAC (test
conditions). As a result, the different techniques in use by
converter manufacturers can lead to consistently different
results. An engineer should understand the advantage and
limitations of a given test method before using the specified
settling time as a basis for design.
The approach used for several years at Intersil calls for a strobed
comparator to sense final perturbations of the DAC output
waveform. This gives the LSB a reasonable magnitude (814mV)
for the HS-565BRH, HS-565BEH, which provides the comparator
with enough overdrive to establish an accurate
±0.50
LSB
window about the final settled value. Also, the required test
conditions simulate the DACs environment for a common
application - use in a successive approximation A/D converter.
Considerable experience has shown this to be a reliable and
repeatable way to measure settling time.
The usual specification is based on a 10V step, produced by
simultaneously switching all bits from off-to-on (tON) or on-to-off
(tOFF). The slower of the two cases is specified, as measured
from 50% of the digital input transition to the final entry within a
window of ±0.50 LSB about the settled value. Four
measurements characterize a given type of DAC:
(a)
(b)
(c)
(d)
tON, to final value +0.50 LSB
tON, to final value -0.50 LSB
tOFF, to final value +0.50 LSB
OFF, to final value -0.50 LSB
(Cases (b) and (c) may be eliminated unless the overshoot
exceeds 0.50 LSB). For example, refer to Figures 4A and 4B for
the measurement of case (d).
Procedure
As shown in Figure 4B, settling time equals tX plus the
comparator delay (tD = 15ns). To measure tX,
• Adjust the delay on generator number 2 for a tX of several
microseconds. This assures that the DAC output has settled to
its final wave.
• Switch on the LSB (+5V)
• Adjust the VLSB supply for 50% triggering at COMPARATOR
OUT. This is indicated by traces of equal brightness on the
oscilloscope display as shown in Figure 4B. Note DVM reading.
• Switch to LSB to Pulse (P)
• Readjust the VLSB supply for 50% triggering as before, and
note DVM reading. One LSB equals one tenth the difference in
the DVM readings noted above.
• Adjust the VLSB supply to reduce the DVM reading by 5 LSBs
(DVM reads 10X, so this sets the comparator to sense the final
settled value minus 0.50 LSB). Comparator output disappears.
• Reduce generator number 2 delay until comparator output
reappears, and adjust for “equal brightness”.
• Measure tX from scope as shown in Figure 4B. Settling time
equals tX + tD, i.e., tX + 15ns.
TABLE 1. OPERATING MODES AND CALIBRATION
CIRCUIT CONNECTIONS
MODE
Unipolar (See Figure 2)
OUTPUT
RANGE
0 to +10V
0 to +5V
Bipolar (See Figure 3)
±10V
±5V
±2.5V
PIN 10
TO
VO
VO
NC
PIN 11
TO
Pin 10
Pin 9
VO
RESISTOR
(R)
1.43k
1.1k
1.69k
APPLY
INPUT CODE
All 0’s
All 1’s
All 0’s
All 1’s
All 0’s
All 1’s
All 0’s
All 1’s
All 0’s
All 1’s
CALIBRATION
ADJUST
R1
R2
R1
R2
R3
R4
R3
R4
R3
R4
TO SET VO
0V
+9.99756V
0V
+4.99878V
-10V
+9.99512V
-5V
+4.99756V
-2.5V
+2.49878V
VO
VO
Pin 10
Pin 9
1.43k
1.1k
5
FN4607.4
May 7, 2012