T1/E1 Short Haul Transceiver with Crystal-less Jitter Attenuation — LXT351
5.0
Test Specifications
Note: Table 20 through Table 31 and Figure 12 through Figure 21 represent the performance
specifications of the LXT350/351 and are guaranteed by test except, where noted, by design. The
minimum and maximum values listed in Table 22 through Table 31 are guaranteed over the
recommended operating conditions specified in Table 21.
Table 20. Absolute Maximum Ratings
Parameter
Sym
Min
Max
Unit
DC supply (reference to GND)
Input voltage, any pin 1
Input current, any pin 2
Storage Temperature
VCC, TVCC
VIN
–
GND - 0.3 V
- 10
6.0
VCC + 0.3 V
10
V
V
IIN
mA
° C
TSTG
-65
150
Caution: Exceeding these values may cause permanent damage.
Caution: Functional operation under these conditions is not implied.
Caution: Exposure to maximum rating conditions for extended periods may affect device reliability.
1. TVCC and VCC must not differ by more than 0.3 V during operation. TGND and GND must not differ by more than 0.3 V
during operation.
2. Transient currents of up to 100 mA will not cause SCR latch-up. TTIP, TRING, TVCC, and TGND can withstand continuous
currents of up to 100 mA.
Table 21. Recommended Operating Conditions
Parameter
DC supply 2
Sym
Min
Typ1
Max
Unit
Test Conditions
VCC,TVCC
4.75
- 40
–
5.0
25
5.25
85
V
Ambient operating temperature
TA
PD
PD
PD
PD
° C
310
225
275
215
380
295
330
270
mW
mW
mW
mW
100% mark density
T1
Total power dissipation3
E1
–
50% mark density
100% mark density
50% mark density
–
–
1. Typical figures are at 25° C and are for design aid only; not guaranteed and not subject to production testing.
2. TVCC and VCC must not differ by more than 0.3 V.
3. Power dissipation while driving 75 Ω load over operating range for T1 operation or 60 Ω load for E1 operation. Includes
power dissipation on device and load. Digital levels are within 10% of the supply rails and digital outputs driving a 50 pF
capacitive load.
Datasheet
33
INTEL [ INTEL ]
