28F010
AC TESTING INPUT/OUTPUT
(1)
WAVEFORM
HIGH SPEED AC TESTING INPUT/OUTPUT
(2)
WAVEFORM
290207–7
290207–8
AC test inputs are driven at V
(2.4 V
) for a Logic
TTL
) for a Logic ‘‘0’’. Input timing
AC test inputs are driven at 3.0V for a Logic ‘‘1’’ and
0.0V for a Logic ‘‘0’’. Input timing begins, and output
timing ends, at 1.5V. Input rise and fall times (10% to
OH
‘‘1’’ and V
(0.45 V
OL
begins at V (2.0 V
ing ends at V and V . Input rise and fall times (10%
TTL
) and V (0.8 V
). Output tim-
IH
TTL IL TTL
k
90%) 10 ns.
IH IL
k
to 90%) 10 ns.
(1)
(2)
AC TESTING LOAD CIRCUIT
HIGH SPEED AC TESTING LOAD CIRCUIT
e
includes Jig Capacitance
e
includes Jig Capacitance
e
3.3 KX
C
C
R
100 pF
C
C
R
30 pF
L
L
L
L
290207–22
290207–23
e
3.3 KX
L
L
(1)
(2)
HIGH-SPEED AC TEST CONDITIONS
AC TEST CONDITIONS
Input Rise and Fall Times (10% to 90%)ÀÀÀÀÀÀ10 ns
Input Pulse Levels ÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀ0.45V and 2.4V
Input Timing Reference Level ÀÀÀÀÀÀÀ0.8V and 2.0V
Output Timing Reference Level ÀÀÀÀÀÀ0.8V and 2.0V
Capacitive LoadÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀ100 pF
Input Rise and Fall Times (10% to 90%)ÀÀÀÀÀÀ10 ns
Input Pulse Levels ÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀ0.0V and 3.0V
Input Timing Reference Level ÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀ1.5V
Output Timing Reference Level ÀÀÀÀÀÀÀÀÀÀÀÀÀÀ1.5V
Capacitive LoadÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀ30 pF
NOTES:
1. Testing characteristics for 28F010-65 in standard configuration, and 28F010-90, 28F010-120, and 28F010-150.
2. Testing characteristics for 28F010-65 in high speed configuration.
20
INTEL [ INTEL ]
