Electrical Specifications
maximum allowable overshoot above VID). These specifications apply to the processor
die voltage as measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands and
across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands.
Table 2-17. V
CC
Overshoot Specifications
Symbol
V
OS_MAX
T
OS_MAX
Parameter
Magnitude of V
CC
overshoot above VID
Time duration of V
CC
overshoot above VID
Min
Max
50
25
Units
mV
µs
Figure
Notes
Figure 2-5.
V
CC
Overshoot Example Waveform
Example Overshoot Waveform
VID + 0.050
V
OS
Voltage [V]
VID - 0.000
T
OS
0
5
10
15
20
25
Time [us]
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID
Notes:
1.
V
OS
is the measured overshoot voltage above VID.
2.
T
OS
is the measured time duration above VID.
2.12.2
Die Voltage Validation
Core voltage (VCC) overshoot events at the processor must meet the specifications in
when measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands
and across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Overshoot events that
are < 10 ns in duration may be ignored. These measurement of processor die level
overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
§
32
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
INTEL [ INTEL CORPORATION ]
