Operational Description
DIU
DIU
*
*
TIU
DR
SCZ
SSZ
DR
Test Mode
Continuous Puls.
Test Mode
Single Pulses
G4 Pend. Deact.
i0
*
ic
*
is
*
(i0 during 16 ms) or
(32 ms timeout)
DID
DIU
DR
G4 Unackn.
i0
*
DID
DIU
DID
TIM, EI
RST
G1 Deactivated
ARD
i0
i0
i1
ARU
DID
G1 i1 Detected
i0
i1
ARD
ARU ARD
AIU
G2 Pend. Act.
i3
i2
i3
OUT
Ind.
IN
RSYD
R
Cmd.
iy
AIU
ARD
TIU
AID
IOM
AID
State
G2 Synchronized
G3 Activated
Any
Info
Any
i2/i4
S
ix
i2
Info
ARD
RSYD
RSYD
TIU RSYD
:
TIU Transparent Indication
Lost Framing U
:
can be AIU, RSYU, LSL
AID
Any
Info
:
is Single Pulses, 4 kHz
ic
:
ic Continuous Pulses, 96 kHz
ITD02335
Figure 77
State Diagram of NT Mode
Semiconductor Group
182
INFINEON [ Infineon ]
