Operational Description
TIU
DIU
Test Mode
DIU
TM
SSP
TIU
DR
SSZ
SCZ
DR
Test Mode
Continuous Puls.
G4 Pend. Deact.
Continuous Puls.
DR
ic
*
is
*
i0
*
(i0 during 16 ms) or
(32 ms timeout)
DID
DIU
DR
G4 Unackn.
i0
*
DID
DIU
DID
RST
G1 Deactivated
i0
i0
OUT
Ind.
IN
ARD+ i1
DID
ARD
ARU
R
Cmd.
IOM
State
G2 Synchronized
i0
S
ix
iy
i2
i1
i3
:
TIU Transparent Indication Upstream
DID
TIU
:
can be AIU, RSYU, LSL
ARD
:
is Single Pulses, 4 kHz
G3 Activated
:
ic Continuous Pulses, 96 kHz
Any
i2/i4
Info
ITD02334
Figure 76
State Diagram of LT-S Mode
Semiconductor Group
179