Si4430/31/32-B1
Table 3. Receiver AC Electrical Characteristics1
Parameter
RX Frequency
Range—Si4431/32
Symbol
Conditions
Min
Typ
Max Units
240
—
930
960
—
MHz
MHz
dBm
F
RX
RX Frequency
900
—
—
F
RX
Range—Si4430
2
RX Sensitivity
(BER < 0.1%)
–121
P
RX_2
(2 kbps, GFSK, BT = 0.5,
3
f = 5 kHz)
(BER < 0.1%)
—
—
—
–108
–104
–101
—
—
—
dBm
dBm
dBm
P
RX_40
(40 kbps, GFSK, BT = 0.5,
3
f = 20 kHz)
(BER < 0.1%)
P
P
RX_100
RX_125
(100 kbps, GFSK, BT = 0.5,
3
f = 50 kHz)
(BER < 0.1%)
(125 kbps, GFSK, BT = 0.5,
f = 62.5 kHz)
(BER < 0.1%)
(4.8 kbps, 350 kHz BW, OOK)
—
—
–110
–102
—
—
dBm
dBm
P
RX_OOK
3
(BER < 0.1%)
(40 kbps, 400 kHz BW, OOK)
3
3
RX Channel Bandwidth
2.6
—
—
0
620
0.1
kHz
BW
BER Variation vs Power
Up to +5 dBm Input Level
ppm
P
RX_RES
3
Level
3
LNA Input Impedance
915 MHz
868 MHz
433 MHz
315 MHz
—
—
—
—
—
51–60j
54–63j
89–110j
107–137j
±0.5
—
—
—
—
—
R
IN-RX
(Unmatched—measured
differentially across RX
input pins)
RSSI Resolution
dB
dB
dB
dB
RES
RSSI
1-CH
2-CH
3-CH
3
1-Ch Offset Selectivity
Desired Ref Signal 3 dB above sensitivity,
BER < 0.1%. Interferer and desired modu-
lated with 40 kbps F = 20 kHz GFSK with
BT = 0.5, channel spacing = 150 kHz
—
—
—
–31
–35
–40
—
—
—
C/I
C/I
C/I
3
2-Ch Offset Selectivity
3
3-Ch Offset Selectivity
3
Blocking at 1 MHz Offset
Blocking at 4 MHz Offset
Blocking at 8 MHz Offset
Desired Ref Signal 3 dB above sensitivity.
Interferer and desired modulated with
40 kbps F = 20 kHz GFSK with BT = 0.5
—
—
—
—
–52
–56
–63
–30
—
—
—
—
dB
dB
dB
dB
1M
4M
8M
BLOCK
BLOCK
BLOCK
3
3
3
Image Rejection
Rejection at the image frequency.
IF=937 kHz
Im
REJ
3
Spurious Emissions
Measured at RX pins
—
—
–54
dBm
P
OB_RX1
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are listed
in the "Production Test Conditions" section on page 14.
2. Receive sensitivity at multiples of 30 MHz may be degraded. If channels with a multiple of 30 MHz are required it is
recommended to shift the crystal frequency. Contact Silicon Labs Applications Support for recommendations.
3. Guaranteed by qualification. Qualification test conditions are listed in the "Production Test Conditions" section on page 14.
Rev 1.0
9
IBM [ IBM ]
