IBM0418A81BLAB IBM0436A81BLAB
IBM0418A41BLAB IBM0436A41BLAB
8Mb (256Kx36 & 512x18) and 4Mb (128Kx36 & 256Kx18) SRAM
Preliminary
AC Test Conditions T(A = 0 to +85°C, VDD = 2.5V -5%, +5%, VDDQ = 1.5, 1.8 V)
Parameter
Output Driver Supply Voltage
Symbol
Conditions
1.5, 1.8
1.5
Units
V
Notes
V
DDQ
V
Input High Level
V
IH
V
Input Low Level
0.3
V
IL
V
Input Reference Voltage
Differential Clocks Voltage
Clocks Common Mode Voltage
Input Rise Time
0.75, 0.90
0.75
V
REF
V
V
DIF-CLK
CM-CLK
V
0.75, 0.9
0.5
V
T
ns
R
T
Input Fall Time
0.5
0.9
ns
V
F
I/O Signals Reference Level (except K, C Clocks)
Clocks Reference Level
Differential Cross Point
V
1, 2
Output Load Conditions
1. See the AC Test Loading figure below.
2. Parameter tested with RQ = 250Ω and V
= 1.8 V.
DDQ
AC Test Loading
Ω
50
0.75, 0.9V
Ω
50
5pF
0.9V
Ω
25
DQ
Ω
50
Ω
0.75, 0.9V
50
5pF
crrh2519.07
12/13/00
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
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