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HY5PS12421BFP-Y5 参数 Datasheet PDF下载

HY5PS12421BFP-Y5图片预览
型号: HY5PS12421BFP-Y5
PDF下载: 下载PDF文件 查看货源
内容描述: 512MB DDR2 SDRAM [512Mb DDR2 SDRAM]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 38 页 / 612 K
品牌: HYNIX [ HYNIX SEMICONDUCTOR ]
 浏览型号HY5PS12421BFP-Y5的Datasheet PDF文件第24页浏览型号HY5PS12421BFP-Y5的Datasheet PDF文件第25页浏览型号HY5PS12421BFP-Y5的Datasheet PDF文件第26页浏览型号HY5PS12421BFP-Y5的Datasheet PDF文件第27页浏览型号HY5PS12421BFP-Y5的Datasheet PDF文件第29页浏览型号HY5PS12421BFP-Y5的Datasheet PDF文件第30页浏览型号HY5PS12421BFP-Y5的Datasheet PDF文件第31页浏览型号HY5PS12421BFP-Y5的Datasheet PDF文件第32页  
1HY5PS12421B(L)FP  
1HY5PS12821B(L)FP  
1HY5PS121621B(L)FP  
Although for slow slew rates the total setup time might be negative(i.e. a valid input signal will not have reached VIH/  
IL(ac) at the time of the rising clock transition) a valid input signal is still required to complete the transition and reach  
VIH/IL(ac).  
For slew rate in between the values listed in table x, the derating valued may obtained by linear interpolation.  
These values are typically not subject to production test. They are verified by design and characterization.  
Hold(tDH) nominal slew rate for a rising signal is defined as the slew rate between the last crossing of Vil(dc) max and  
the first crossing of VREF(dc). Hold (tDH) nominal slew rate for a falling signal is defined as the slew rate between the  
last crossing of Vih(dc) min and the first crossing of VREF(dc). If the actual signal is earlier than the nominal slew rate  
line anywhere between shaded ‘dc to VREF(dc) region’, the slew rate of a tangent line to the actual signal from the dc  
level to VREF(dc) level is used for derating value(see Fig d.)  
Although for slow slew rates the total setup time might be negative(i.e. a valid input signal will not have reached VIH/  
IL(ac) at the time of the rising clock transition) a valid input signal is still required to complete the transition and reach  
VIH/IL(ac).  
For slew rate in between the values listed in table x, the derating valued may obtained by linear interpolation.  
These values are typically not subject to production test. They are verified by design and characterization.  
Rev. 0.7 / Oct. 2007  
28  
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