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HT48R063 参数 Datasheet PDF下载

HT48R063图片预览
型号: HT48R063
PDF下载: 下载PDF文件 查看货源
内容描述: 增强I / O型8位OTP MCU [Enhanced I/O Type 8-Bit OTP MCU]
分类和应用:
文件页数/大小: 93 页 / 511 K
品牌: HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
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HT48R063/064/065/066/0662/067  
Pin Name  
PC3/PWM1  
Function OPT  
PCn  
I/T  
O/T  
Description  
PCPU ST CMOS General purpose I/O. Register enabled pull-up.  
PWM1 CTRL1  
CMOS PWM output  
PCPU ST CMOS General purpose I/O. Register enabled pull-up.  
CO LXT Low frequency crystal pin  
PCPU ST CMOS General purpose I/O. Register enabled pull-up.  
CO LXT Low frequency crystal pin  
¾
PCn  
XT2  
PCn  
XT1  
PC4/XT2  
PC5/XT1  
¾
¾
PD0, PD1  
PD3~PD7  
PDn  
PDPU ST CMOS General purpose I/O. Register enabled pull-up.  
PDPU ST CMOS General purpose I/O. Register enabled pull-up.  
PDn  
TC2  
PEn  
PFn  
VDD  
VSS  
PD2/TC2  
ST  
¾
¾
External Timer 2 clock input - HT48R0662 doesn¢t have TC2  
PE0~PE7  
PF0, PF1  
VDD  
PEPU ST CMOS General purpose I/O. Register enabled pull-up.  
PFPU ST CMOS General purpose I/O. Register enabled pull-up.  
PWR  
PWR  
Power supply  
Ground  
¾
¾
¾
¾
VSS  
Note: I/T: Input type; O/T: Output type  
OPT: Optional by configuration option (CO) or register option  
PWR: Power; CO: Configuration option  
ST: Schmitt Trigger input; CMOS: CMOS output  
SCOM: Software controlled LCD COM  
HXT: High frequency crystal oscillator  
LXT: Low frequency crystal oscillator  
Absolute Maximum Ratings  
Supply Voltage...........................VSS-0.3V to VSS+6.0V  
Input Voltage..............................VSS-0.3V to VDD+0.3V  
Storage Temperature............................-50°C to 125°C  
Operating Temperature...........................-40°C to 85°C  
I
OL Total ..............................................................100mA  
I
OH Total............................................................-100mA  
Total Power Dissipation .....................................500mW  
Note: These are stress ratings only. Stresses exceeding the range specified under ²Absolute Maximum Ratings² may  
cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed  
in the specification is not implied and prolonged exposure to extreme conditions may affect device reliability.  
Rev. 1.10  
9
June 9, 2009