HS-1840RH
Burn-In/Life Test Circuits
R
R
+VS
+VS
-VS
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1
2
1
28
27
26
25
24
23
22
21
20
19
18
17
16
15
-VS
2
R
R
3
3
R
R
4
4
5
5
6
6
7
7
8
8
9
9
10
11
12
13
14
10
11
F5
GND
GND
F4
12
13
14
F1
F3
F2
VR
R
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
STATIC BURN-IN TEST CIRCUIT
NOTES:
NOTES:
1
VS+ = +15.5V ±0.5V, VS- = -15.5V ±0.5V
R = 1kΩ ±5%, / W
4
R = 1kΩ ±5%
C1 = C2 = 0.01µF minimum, 1 each per socket, minimum
VS+ = 15.5V ±0.5V, VS- = -15.5V ±0.5V, VR = 15.5 ±0.5V
C1 = C2 = 0.01µF ±10%, 1 each per socket, minimum
D1 = D2 = 1N4002, 1 each per board, minimum
Input Signals: square wave, 50% duty cycle, 0V to 15V peak ±10%
F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16
NOTES:
1. The above test circuits are utilized for all package types.
2. The Dynamic Test Circuit is utilized for all life testing.
Irradiation Circuit
HS-1840RH 28 LEAD DIP
+15V
1
2
28
-15V
NC
NC
27
26
25
24
23
22
21
20
19
18
17
16
15
1KΩ
3
+1V
4
5
6
7
8
9
10
11
12
13
14
+5V
NOTE: All irradiation testing is performed in the 28 lead CerDIP package.
Spec Number 518022
8
HARRIS [ HARRIS CORPORATION ]
