HANBit
HMF51232J4V
ERASE AND PROGRAMMING PERFORMANCE
LIMITS
PARAMETER
UNIT
sec
us
COMMENTS
MIN.
TYP.
MAX.
Excludes 00H programming
prior to erasure
Sector Erase Time
-
1.7
15
Excludes system-level
overhead
Byte Programming Time
Chip Programming Time
-
-
9
300
Excludes system-level
overhead
4.5
13.5
sec
CAPACITANCE
PARAMETER
SYMBOL
PARAMETER
TEST SETUP
TYP.
MAX
UNIT
DESCRIPTION
CIN
COUT
CIN2
Input Capacitance
VIN = 0
VOUT = 0
VIN = 0
6
7.5
12
9
pF
pF
pF
Output Capacitance
8.5
7.5
Control Pin Capacitance
: Test conditions TA = 25o C, f=1.0 MHz.
Notes
AC CHARACTERISTICS
u Read Only Operations Characteristics
PARAMETER
SYMBOLS
DESCRIPTION
TEST SETUP
-55
-90
UNIT
JEDEC STANDARD
tAVAV
tAVQV
tRC
Read Cycle Time
Min
55
55
90
90
ns
ns
tACC
/CE = VIL
/OE = VIL
/OE = VIL
Address to Output Delay
Max
tELQV
tGLQV
tEHQZ
tGHQZ
tCE
tOE
tDF
tDF
Chip Enable to Output Delay
Chip Enable to Output Delay
Chip Enable to Output High-Z
Output Enable to Output High-Z
Max
Max
Max
Max
55
30
25
25
90
35
30
30
ns
ns
ns
ns
Output Hold Time From Addresses,
/CE or /OE, Whichever Occurs First
tAXQX
tQH
Min
0
0
ns
Notes : Test Conditions : Output Load : 1TTL gate and 100 pF
Input rise and fall times : 5 ns
Input pulse levels : 0V to 3.0V
Timing measurement reference level
Input : 1.5V / Output : 1.5V
4
URL: www.hbe.co.kr
HANBit Electronics Co., Ltd.
REV.02(August,2002)
HANBIT [ HANBIT ELECTRONICS CO.,LTD ]
