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MCF52223CAF80 参数 Datasheet PDF下载

MCF52223CAF80图片预览
型号: MCF52223CAF80
PDF下载: 下载PDF文件 查看货源
内容描述: MCF52259的ColdFire微控制器 [MCF52259 ColdFire Microcontroller]
分类和应用: 微控制器
文件页数/大小: 50 页 / 1464 K
品牌: FREESCALE [ Freescale ]
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Electrical Characteristics  
Table 10. Thermal Characteristics (continued)  
Characteristic  
Symbol  
Value  
Unit  
100 LQFP Junction to ambient, natural convection  
Single layer board (1s)  
θJA  
θJA  
θJMA  
θJMA  
θJB  
θJC  
Ψjt  
5313,14  
391,15  
421,3  
331,3  
2516  
917  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
oC  
Junction to ambient, natural convection  
Junction to ambient, (@200 ft/min)  
Junction to ambient, (@200 ft/min)  
Junction to board  
Four layer board (2s2p)  
Single layer board (1s)  
Four layer board (2s2p)  
Junction to case  
Natural convection  
Junction to top of package  
218  
Maximum operating junction temperature  
Tj  
105  
1
θ
JA and Ψjt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection. Freescale  
recommends the use of θJA and power dissipation specifications in the system design to prevent device junction  
temperatures from exceeding the rated specification. System designers should be aware that device junction temperatures  
can be significantly influenced by board layout and surrounding devices. Conformance to the device junction temperature  
specification can be verified by physical measurement in the customer’s system using the Ψjt parameter, the device power  
dissipation, and the method described in EIA/JESD Standard 51-2.  
2
3
4
Per JEDEC JESD51-2 with the single-layer board (JESD51-3) horizontal.  
Per JEDEC JESD51-6 with the board JESD51-7) horizontal.  
Thermal resistance between the die and the printed circuit board in conformance with JEDEC JESD51-8. Board  
temperature is measured on the top surface of the board near the package.  
5
6
Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883  
Method 1012.1).  
Thermal characterization parameter indicating the temperature difference between package top and the junction  
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written  
in conformance with Psi-JT.  
7
θ
JA and Ψjt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection. Freescale  
recommends the use of θJA and power dissipation specifications in the system design to prevent device junction  
temperatures from exceeding the rated specification. System designers should be aware that device junction temperatures  
can be significantly influenced by board layout and surrounding devices. Conformance to the device junction temperature  
specification can be verified by physical measurement in the customer’s system using the Ψjt parameter, the device power  
dissipation, and the method described in EIA/JESD Standard 51-2.  
8
9
Per JEDEC JESD51-2 with the single-layer board (JESD51-3) horizontal.  
Per JEDEC JESD51-6 with the board JESD51-7) horizontal.  
10 Thermal resistance between the die and the printed circuit board in conformance with JEDEC JESD51-8. Board  
temperature is measured on the top surface of the board near the package.  
11 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883  
Method 1012.1).  
12 Thermal characterization parameter indicating the temperature difference between package top and the junction  
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written  
in conformance with Psi-JT.  
13 θJA and Ψjt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection. Freescale  
recommends the use of θJA and power dissipation specifications in the system design to prevent device junction  
temperatures from exceeding the rated specification. System designers should be aware that device junction temperatures  
can be significantly influenced by board layout and surrounding devices. Conformance to the device junction temperature  
specification can be verified by physical measurement in the customer’s system using the Ψjt parameter, the device power  
dissipation, and the method described in EIA/JESD Standard 51-2.  
14 Per JEDEC JESD51-2 with the single-layer board (JESD51-3) horizontal.  
15 Per JEDEC JESD51-6 with the board JESD51-7) horizontal.  
MCF52259 ColdFire Microcontroller, Rev. 0  
Freescale Semiconductor  
31  
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