Ratings
6.3 ESD handling ratings
Although damage from electrostatic discharge (ESD) is much less common on these
devices than on early CMOS circuits, use normal handling precautions to avoid exposure
to static discharge. Qualification tests are performed to ensure that these devices can
withstand exposure to reasonable levels of static without suffering any permanent
damage.
All ESD testing is in conformity with AEC-Q100 Stress Test Qualification. During the
device qualification ESD stresses were performed for the human body model (HBM), the
machine model (MM), and the charge device model (CDM).
All latch-up testing is in conformity with AEC-Q100 Stress Test Qualification.
A device is defined as a failure if after exposure to ESD pulses the device no longer
meets the device specification. Complete DC parametric and functional testing is
performed per the applicable device specification at room temperature followed by hot
temperature, unless specified otherwise in the device specification.
Table 3. ESD/Latch-up Protection
Characteristic1
Min
–2000
–200
–500
–100
Max
+2000
+200
+500
+100
Unit
V
ESD for Human Body Model (HBM)
ESD for Machine Model (MM)
ESD for Charge Device Model (CDM)
V
V
Latch-up current at TA= 85°C (ILAT
)
mA
1. Parameter is achieved by design characterization on a small sample size from typical devices under typical conditions
unless otherwise noted.
6.4 Voltage and current operating ratings
Absolute maximum ratings are stress ratings only, and functional operation at the
maxima is not guaranteed. Stress beyond the limits specified in Table 4 may affect device
reliability or cause permanent damage to the device.
Table 4. Absolute Maximum Ratings (VSS = 0 V, VSSA = 0 V)
Characteristic
Supply Voltage Range
Symbol
VDD
Notes1
Min
-0.3
-0.3
-0.3
-0.3
-0.3
Max
4.0
4.0
4.0
0.3
0.3
Unit
V
Analog Supply Voltage Range
ADC High Voltage Reference
Voltage difference VDD to VDDA
Voltage difference VSS to VSSA
VDDA
V
VREFHx
ΔVDD
ΔVSS
V
V
V
Table continues on the next page...
MC56F844xx Advance Information Data Sheet, Rev. 2, 06/2012.
Freescale Semiconductor, Inc.
23
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