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56F801_1 参数 Datasheet PDF下载

56F801_1图片预览
型号: 56F801_1
PDF下载: 下载PDF文件 查看货源
内容描述: 16位数字信号控制器 [16-bit Digital Signal Controllers]
分类和应用: 控制器
文件页数/大小: 48 页 / 536 K
品牌: FREESCALE [ Freescale ]
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2.10 JTAG/OnCE  
Table 2-12 JTAG/On-Chip Emulation (OnCE) Signals  
No. of  
Pins  
Signal  
Name  
Signal  
Type  
State During  
Reset  
Signal Description  
1
TCK  
Input  
Input, pulled Test Clock Input—This input pin provides a gated clock to synchronize the  
(Schmitt) low internally test logic and shift serial data to the JTAG/OnCE port. The pin is connected  
internally to a pull-down resistor.  
1
TMS  
Input  
Input, pulled Test Mode Select Input—This input pin is used to sequence the JTAG  
(Schmitt) high internally TAP controller’s state machine. It is sampled on the rising edge of TCK and  
has an on-chip pull-up resistor.  
Note: Always tie the TMS pin to VDD through a 2.2K resistor.  
1
1
1
TDI  
TDO  
TRST  
Input  
Input, pulled Test Data Input—This input pin provides a serial input data stream to the  
(Schmitt) high internally JTAG/OnCE port. It is sampled on the rising edge of TCK and has an  
on-chip pull-up resistor.  
Output  
Tri-stated  
Test Data Output—This tri-statable output pin provides a serial output data  
stream from the JTAG/OnCE port. It is driven in the Shift-IR and Shift-DR  
controller states, and changes on the falling edge of TCK.  
Input  
Input, pulled Test Reset—As an input, a low signal on this pin provides a reset signal to  
(Schmitt) high internally the JTAG TAP controller. To ensure complete hardware reset, TRST should  
be asserted whenever RESET is asserted. The only exception occurs in a  
debugging environment when a hardware device reset is required and it is  
necessary not to reset the OnCE/JTAG module. In this case, assert RESET,  
but do not assert TRST.  
Note: For normal operation, connect TRST directly to VSS. If the design is to be  
used in a debugging environment, TRST may be tied to VSS through a 1K resistor.  
1
DE  
Output  
Output  
Debug Event—DE provides a low pulse on recognized debug events.  
Part 3 Specifications  
3.1 General Characteristics  
The 56F801 is fabricated in high-density CMOS with 5-volt tolerant TTL-compatible digital inputs. The  
term “5-volt tolerant” refers to the capability of an I/O pin, built on a 3.3V compatible process technology,  
to withstand a voltage up to 5.5V without damaging the device. Many systems have a mixture of devices  
designed for 3.3V and 5V power supplies. In such systems, a bus may carry both 3.3V and 5V- compatible  
I/O voltage levels (a standard 3.3V I/O is designed to receive a maximum voltage of 3.3V ± 10% during  
normal operation without causing damage). This 5V-tolerant capability therefore offers the power savings  
of 3.3V I/O levels while being able to receive 5V levels without being damaged.  
Absolute maximum ratings given in Table 3-1 are stress ratings only, and functional operation at the  
maximum is not guaranteed. Stress beyond these ratings may affect device reliability or cause permanent  
damage to the device.  
56F801 Technical Data, Rev. 17  
14  
Freescale Semiconductor  
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