Document Revision History
Version History
Rev 0
Description of Change
Initial release
Rev 1
Updates to Part 10, Specifications,
Table 10-1, added maximum clamp current, per pin
Table 10-11, clarified variation over temperature table and graph
Table 10-15, added LIN slave timing
Rev 2
Rev 3
Added alternate pins to Figure 11-1 and Table 11-1.
Corrected bit selects in Timer Channel 3 Input (TC3_INP) bit 9, Section 6.3.1.7, clarified
Section 1.4.1, and simplified notes in Table 10-9,
Rev 4
Rev 5
Added clarification on sync inputs in Section 1.4.1, added voltage difference specification to
Table 10-1 and Table 10-4, deleted formula for Ambient Operating Temperature in Table 10-4,
and a note for pin group 3, corrected Table 8-1, error in Port C peripheral function configuration,
updated notes in Table 10-9. Added RoHs and “pb-free” language to back cover.
Updates to Section 10
Table 10-5, corrected max values for ADC Input Current High and Low; corrected typ value for
pull-up disabled Digital Input Current Low (a)
Table 10-6, corrected typ and added max values for Standby > Stop and Powerdown modes
Table 10-7, corrected min value for Low-Voltage Interrupt for 3.3V
Table 10-11, corrected typ and max values and units for PLL lock time
Table 10-12, corrected typ values for Relaxation Oscillator output frequency and variation over
temperature (also increased temp range to 150 degreesC) and added variation over
temperature from 0—105 degreesC
Updated Figure 10-5
Table 10-19, updated max values for Integral Non-Linearity full input signal range, Negative
Differential Non-Linearity, ADC internal clock, Offset Voltage Internal Ref, Gain Error and Offset
Voltage External Ref; updated typ values for Negative Differential Non-Linearity, Offset Voltage
Internal Ref, Gain Error and Offset Voltage External Ref; added new min values and corrected
typ values for Signal-to-noise ratio, Total Harmonic Distortion, Spurious Free Dynamic Range,
Signal-to-noise plus distortion, Effective Number of Bits
Rev 6
Added details to Section 1. Clarified language in State During Reset column in Table 2-3;
corrected flash data retention temperature in Table 10-4; moved input current high/low
toTable 10-19 and location of footnotes in Table 10-5; reorganized Table 10-19; clarified title of
Figure 10-1.
Rev. 7
• In Table 10-4, added an entry for flash data retention with less than 100 program/erase
cycles (minimum 20 years).
• In Table 10-6, changed the device clock speed in STOP mode from 8MHz to 4MHz.
• In Table 10-12, changed the typical relaxation oscillator output frequency in Standby mode
from 400kHz to 200kHz.
Rev. 8
In Table 10-19, changed the maximum ADC internal clock frequency from 8MHz to 5.33MHz.
56F8014 Technical Data, Rev. 9
2
Freescale Semiconductor
Preliminary
FREESCALE [ Freescale ]
