ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 4. Dynamic Electrical Characteristics
Characteristics noted under conditions 7.0 V ≤ VSUP ≤ 18 V, -40°C ≤ TA ≤ 125°C, GND = 0 V unless otherwise noted. Typical
values noted reflect the approximate parameter means at TA = 25°C under nominal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
LIN OUTPUT TIMING CHARACTERISTICS FOR NORMAL MODE
Dominant Propagation Delay Time TXD to LIN (6)
µs
Measurement Threshold (50% TXD to 58.1% V
SUP)
t
(MIN)
DOM
—
—
—
—
50
50
Measurement Threshold (50% TXD to 28.4% V
SUP)
t
(MAX)
DOM
Recessive Propagation Delay Time TXD to LIN (6)
µs
µs
Measurement Threshold (50% TXD to 42.2% V
SUP)
t
(MIN)
—
—
—
—
50
50
REC
Measurement Threshold (50% TXD to 74.4% V
SUP)
t
(MAX)
REC
Propagation Delay Time Symmetry
t
t
(MIN) to t
(MAX)
(MIN)
dt
-10.44
-10.44
—
—
8.12
8.12
DOM
DOM
REC
1
2
(MAX) to t
dt
REC
LIN OUTPUT TIMING CHARACTERISTICS FOR SLOW MODE
Dominant Propagation Delay Time TXD to LIN (6)
µs
µs
µs
Measurement Threshold (50% TXD to 61.6% V
SUP)
t
(MIN)
—
—
—
—
100
100
DOM
Measurement Threshold (50% TXD to 25.1% V
SUP)
t
(MAX)
DOM
Recessive Propagation Delay Time TXD to LIN (6)
Measurement Threshold (50% TXD to 38.9% V
SUP)
t
(MIN)
—
—
—
—
100
100
REC
Measurement Threshold (50% TXD to 77.8% V
SUP)
t
(MAX)
REC
Propagation Delay Time Symmetry
t
t
(MIN) to t
(MAX)
(MIN)
dt
dt
-21.88
-21.88
—
—
17.44
17.44
DOM
DOM
REC
1S
2S
(MAX) to t
REC
LIN OUTPUT DRIVER FAST MODE
LIN Fast Slew Rate (Programming Mode)
Fast Slew Rate
dv/dt fast
V/µs
µs
—
—
15
10
—
—
LIN PIN
Overcurrent Shutdown Delay Time (7)
tOV-DELAY
LIN RECEIVER CHARACTERISTICS
Receiver Dominant Propagation Delay Time (8)
LIN LOW to RXD LOW
t
µs
µs
µs
RL
—
—
3.5
3.5
—
6.0
6.0
2.0
Receiver Recessive Propagation Delay Time (8)
LIN HIGH to RXD HIGH
t
RH
Receiver Propagation Delay Time Symmetry
t
R-SYM
-2.0
t
RL - t
RH
Notes
6
7.0 V ≤ V
≤ 18 V. Bus load R and C : 1.0 nF/1.0 kΩ, 6.8 nF/660 Ω, 10 nF/500 Ω.
0 0
SUP
7
8
This parameter is guaranteed by design; however, it is not production tested.
Measured between LIN signal threshold V or V and 50% of RXD signal.
LINL
LINH
33661
Analog Integrated Circuit Device Data
Freescale Semiconductor
7
FREESCALE [ Freescale ]
