Electrical Characteristics (Continued)
Transfer Characteristics (T = -40 to +85°C unless otherwise specified)
A
Symbol
DC Characteristics
Test Conditions
Min.
Typ.* Max.
Unit
I
HIGH Level Output Current
V
= 5.5V, V = 5.5V,
100
µA
OH
CC
O
(2)
I = 250µA, V = 2.0V
F
E
V
LOW Level Output Current
Input Threshold Current
V
= 5.5V, I = 5mA, V = 2.0V,
= 13mA
.35
3
0.6
5
V
OL
CC
F
E
(2)
I
CL
I
V
= 5.5V, V = 0.6V, V = 2.0V,
mA
FT
CC
O
E
I
= 13mA
OL
Isolation Characteristics (T = -40°C to +85°C unless otherwise specified.)
A
Symbol
Characteristics
Test Conditions
Min.
Typ.*
Max.
Unit
I
Input-Output Insulation
Leakage Current
Relative humidity = 45%,
1.0*
µA
I-O
T = 25°C, t = 5s,
A
(12)
V
= 3000 VDC
I-O
V
Withstand Insulation Test
Voltage
RH < 50%, T = 25°C,
2500
V
RMS
ISO
A
(12)
I
≤ 2µA, t = 1 min.
I-O
(12)
12
R
C
Resistance (Input to Output)
V
= 500V
10
0.6
Ω
I-O
I-O
(12)
Capacitance (Input to Output) f = 1MHz
pF
I-O
*All Typicals at V = 5V, T = 25°C
CC
A
Notes:
1. The V supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic
CC
or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible
to the package V and GND pins of each device.
CC
2. Each channel.
3. Enable Input – No pull up resistor required as the device has an internal pull up resistor.
4. t
– Propagation delay is measured from the 3.75mA level on the HIGH to LOW transition of the input current
PLH
pulse to the 1.5 V level on the LOW to HIGH transition of the output voltage pulse.
5. t – Propagation delay is measured from the 3.75mA level on the LOW to HIGH transition of the input current
PHL
pulse to the 1.5 V level on the HIGH to LOW transition of the output voltage pulse.
6. t – Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
r
7. t – Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
f
8. t
– Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input
ELH
voltage pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
9. t – Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input
EHL
voltage pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
10. CM – The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the
H
HIGH state (i.e., V
> 2.0V). Measured in volts per microsecond (V/µs).
OUT
11. CM – The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the
L
LOW output state (i.e., V
< 0.8V). Measured in volts per microsecond (V/µs).
OUT
12. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted
together.
©2005 Fairchild Semiconductor Corporation
6N137, HCPL2601, HCPL2611, HCPL2630, HCPL2631 Rev. 1.0.7
www.fairchildsemi.com
4
FAIRCHILD [ FAIRCHILD SEMICONDUCTOR ]
