Absolute Maximum Ratings (T = 25°C unless otherwise specified)
A
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Value
Units
°C
T
Storage Temperature
Operating Temperature
Lead Solder Temperature
-55 to +125
-40 to +85
STG
T
°C
OPR
T
260 for 10 sec
°C
SOL
EMITTER
I
DC/Average Forward
Input Current
Single Channel
Dual Channel (Each Channel)
50
30
mA
V
F
V
V
Enable Input Voltage Not to Exceed Single Channel
by more than 500mV
5.5
E
V
CC
Reverse Input Voltage
Power Dissipation
Each Channel
5.0
100
45
V
R
P
Single Channel
mW
I
Dual Channel (Each Channel)
DETECTOR
V
Supply Voltage
Output Current
7.0
V
CC
(1 minute max)
I
Single Channel
50
50
7.0
85
60
mA
O
Dual Channel (Each Channel)
Each Channel
V
Output Voltage
V
O
P
Collector Output
Power Dissipation
Single Channel
mW
O
Dual Channel (Each Channel)
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to absolute maximum ratings.
Symbol
Parameter
Min.
0
Max.
250
15
Units
µA
mA
V
I
Input Current, Low Level
FL
I
Input Current, High Level
Supply Voltage, Output
Enable Voltage, Low Level
Enable Voltage, High Level
Low Level Supply Current
Fan Out (TTL load)
*6.3
4.5
0
FH
V
5.5
CC
V
0.8
V
EL
V
2.0
-40
V
V
EH
CC
T
+85
8
°C
A
N
*6.3mA is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshold value
is 5.0mA or less.
©2005 Fairchild Semiconductor Corporation
6N137, HCPL2601, HCPL2611, HCPL2630, HCPL2631 Rev. 1.0.7
www.fairchildsemi.com
2
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