ESMT
DDR II SDRAM
Features
JEDEC Standard
V
DD
= 1.8V
±
0.1V, V
DDQ
= 1.8V
±
0.1V
V
DD
= 1.75V ~ 1.9V, V
DDQ
= 1.75V ~ 1.9V (for speed grade -1.8)
Internal pipelined double-data-rate architecture; two data access per clock cycle
M14D5121632A (2H)
Operation Temperature Condition (T
C
) -40
°
C~95
°
C
8M x 16 Bit x 4 Banks
DDR II SDRAM
Bi-directional differential data strobe (DQS, DQS ); DQS can be disabled for single-ended data strobe operation.
On-chip DLL
Differential clock inputs (CLK and CLK )
DLL aligns DQ and DQS transition with CLK transition
Quad bank operation
CAS Latency : 3, 4, 5, 6, 7
Additive Latency: 0, 1, 2, 3, 4, 5, 6
Burst Type : Sequential and Interleave
Burst Length : 4, 8
All inputs except data & DM are sampled at the rising edge of the system clock(CLK)
Data I/O transitions on both edges of data strobe (DQS)
DQS is edge-aligned with data for READ; center-aligned with data for WRITE
Data mask (DM) for write masking only
Off-Chip-Driver (OCD) impedance adjustment
On-Die-Termination for better signal quality
Special function support
-
-
-
50/ 75/ 150 ohm ODT
High Temperature Self refresh rate enable
Duty Cycle Corrector
Auto & Self refresh
Refresh cycle :
-
-
8192 cycles/64ms (7.8μs refresh interval) at -40
℃ ≦
T
C
≦ +85 ℃
8192 cycles/32ms (3.9μs refresh interval) at
+85 ℃ ＜
T
C
≦
+95
℃
SSTL_18 interface
Elite Semiconductor Memory Technology Inc.
Publication Date : Aug. 2011
Revision : 1.1
1/62
ESMT [ ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC. ]
