欢迎访问ic37.com |
会员登录 免费注册
发布采购

M13S5121632A-4TG2A 参数 Datasheet PDF下载

M13S5121632A-4TG2A图片预览
型号: M13S5121632A-4TG2A
PDF下载: 下载PDF文件 查看货源
内容描述: [DDR DRAM, 32MX16, 0.7ns, CMOS, PDSO66, 0.400 X 0.875 INCH, 0.65 MM PITCH, LEAD FREE, TSOP2-66]
分类和应用: 动态存储器双倍数据速率光电二极管内存集成电路
文件页数/大小: 47 页 / 969 K
品牌: ESMT [ ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC. ]
 浏览型号M13S5121632A-4TG2A的Datasheet PDF文件第4页浏览型号M13S5121632A-4TG2A的Datasheet PDF文件第5页浏览型号M13S5121632A-4TG2A的Datasheet PDF文件第6页浏览型号M13S5121632A-4TG2A的Datasheet PDF文件第7页浏览型号M13S5121632A-4TG2A的Datasheet PDF文件第9页浏览型号M13S5121632A-4TG2A的Datasheet PDF文件第10页浏览型号M13S5121632A-4TG2A的Datasheet PDF文件第11页浏览型号M13S5121632A-4TG2A的Datasheet PDF文件第12页  
ESMT
Command Truth Table
COMMAND
Register
Register
Extended MRS
Mode Register Set
Auto Refresh
Refresh
Self
Refresh
Entry
Exit
CKEn-1 CKEn CS
H
H
H
L
H
H
X
X
H
L
H
X
X
L
L
L
L
H
L
L
RAS
L
L
L
H
X
L
H
CAS
L
L
L
H
X
H
L
WE
M13S5121632A (2A)
DM
X
X
X
X
X
X
BA0,1
A10/AP
A11,A12,
A9~A0
Note
1,2
1,2
3
3
3
3
L
L
H
H
X
H
H
OP CODE
OP CODE
X
X
V
V
Row Address
L
H
Column
Address
(A0~A9)
Column
Address
(A0~A9)
Bank Active & Row Addr.
Read &
Column
Address
Write &
Column
Address
Auto Precharge Disable
Auto Precharge Enable
Auto Precharge Disable
Auto Precharge Enable
Burst Stop
Precharge
Bank Selection
All Banks
Entry
Exit
Precharge Power Down
Mode
Entry
Exit
4
4
4,8
4,6,8
7
H
H
H
H
L
H
L
H
X
X
X
L
H
L
H
X
L
L
L
H
L
X
H
L
H
L
H
L
H
H
L
X
H
X
X
H
X
H
X
H
L
H
H
X
H
X
X
H
X
H
X
H
L
L
L
X
H
X
X
H
X
H
X
H
V
X
X
X
X
X
V
L
H
X
V
X
L
H
X
X
5
Active Power Down
X
X
X
X
No Operation Command
(V = Valid, X = Don’t Care, H = Logic High, L = Logic Low)
Note:
1. OP Code: Operand Code. A0~A12 & BA0~BA1: Program keys. (@EMRS/MRS)
2. EMRS/MRS can be issued only at all banks precharge state.
A new command can be issued 1 clock cycles after EMRS or MRS.
3. Auto refresh functions are same as the CBR refresh of DRAM.
The automatic precharge without row precharge command is meant by “Auto”..
Auto/self refresh can be issued only at all banks precharge state.
4. BA0~BA1: Bank select addresses.
If both BA0 and BA1 are “Low” at read, write, row active and precharge, bank A is selected.
If BA0 is “High” and BA1 is “Low” at read, write, row active and precharge, bank B is selected.
If BA0 is “Low” and BA1 is “High” at read, write, row active and precharge, bank C is selected.
If both BA0 and BA1 are “High” at read, write, row active and precharge, bank D is selected.
5. If A10/AP is “High” at row precharge, BA0 and BA1 are ignored and all banks are selected.
6. During burst write with auto precharge, new read/write command can not be issued.
Another bank read/write command can be issued after the end of burst.
New row active of the associated bank can be issued at t
RP
after end of burst.
7. Burst stop command is valid at every burst length.
8. DM sampling at the rising and falling edges of the DQS and Data-in are masked at the both edges (Write DM latency is 0).
Elite Semiconductor Memory Technology Inc.
Publication Date : May 2012
Revision : 1.1
8/47