EN29LV160A
Test Conditions
3.3 V
2.7 k
Ω
Device Under Test
CL
6.2 k
Ω
Note: Diodes are IN3064 or equivalent
Test Specifications
Test Conditions
Output Load
-70
-90
Unit
1 TTL Gate
Output Load Capacitance, CL
Input Rise and Fall times
Input Pulse Levels
30
5
100
5
pF
ns
V
0.0-3.0
0.0-3.0
Input timing measurement
reference levels
Output timing measurement
reference levels
1.5
1.5
1.5
1.5
V
V
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
27
Rev. I, Issue Date: 2008/07/17