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EN29F010-70SIP 参数 Datasheet PDF下载

EN29F010-70SIP图片预览
型号: EN29F010-70SIP
PDF下载: 下载PDF文件 查看货源
内容描述: 1兆位( 128K ×8位), 5V闪存 [1 Megabit (128K x 8-bit) 5V Flash Memory]
分类和应用: 闪存存储内存集成电路光电二极管
文件页数/大小: 35 页 / 428 K
品牌: EON [ EON SILICON SOLUTION INC. ]
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EN29F010  
EN29F010  
1 Megabit (128K x 8-bit) 5V Flash Memory  
FEATURES  
JEDEC Standard program and erase  
5.0V operation for read/write/erase  
commands  
operations  
JEDEC standard  
polling and toggle  
DATA  
Fast Read Access Time  
bits feature  
- 45ns, 55ns, 70ns, and 90ns  
Single Sector and Chip Erase  
Sector Unprotect Mode  
Sector Architecture:  
- 8 uniform sectors of 16Kbytes each  
- Supports full chip erase  
Embedded Erase and Program Algorithms  
- Individual sector erase supported  
- Sector protection:  
Erase Suspend / Resume modes:  
Read and program another Sector during  
Erase Suspend Mode  
Hardware locking of sectors to prevent  
program or erase operations within  
individual sectors  
0.23 µm triple-metal double-poly  
triple-well CMOS Flash Technology  
High performance program/erase speed  
- Byte program time: 7µs typical  
- Sector erase time: 300ms typical  
- Chip erase time: 3s typical  
Low Vcc write inhibit < 3.2V  
100K endurance cycle  
Package Options  
Low Standby Current  
- 32-pin PDIP  
- 1µA CMOS standby current-typical  
- 1mA TTL standby current  
- 32-pin PLCC  
Low Power Active Current  
- 32-pin 8mm x 20mm TSOP (Type 1)  
- 32-pin 8mm x 14mm TSOP (Type 1)  
- 12mA typical active read current  
- 30mA program/erase current  
Commercial and Industrial Temperature  
Ranges  
GENERAL DESCRIPTION  
The EN29F010 is a 1-Megabit, electrically erasable, read/write non-volatile flash memory.  
Organized into 128K bytes with 8 bits per byte, the 1M of memory is arranged in eight uniform  
sectors of 16Kbytes each. Any byte can be programmed typically in 7µs. The EN29F010 features  
5.0V voltage read and write operation, with access times as fast as 45ns to eliminate the need for  
WAIT states in high-performance microprocessor systems.  
The EN29F010 has separate Output Enable (  
), Chip Enable (  
), and Write Enable (  
)
W E  
OE  
CE  
controls, which eliminate bus contention issues. This device is designed to allow either single  
Sector or full chip erase operation, where each Sector can be individually protected against  
program/erase operations or temporarily unprotected to erase or program. The device can sustain a  
minimum of 100K program/erase cycles on each Sector.  
This Data Sheet may be revised by subsequent versions  
©2003 Eon Silicon Solution, Inc., www.essi.com.tw  
Rev. A, Issue Date: 2003/10/20  
1
or modifications due to changes in technical specifications.