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EDJ1108BABG-DG-E 参数 Datasheet PDF下载

EDJ1108BABG-DG-E图片预览
型号: EDJ1108BABG-DG-E
PDF下载: 下载PDF文件 查看货源
内容描述: 1G位DDR3 SDRAM [1G bits DDR3 SDRAM]
分类和应用: 存储内存集成电路动态存储器双倍数据速率时钟
文件页数/大小: 148 页 / 1878 K
品牌: ELPIDA [ ELPIDA MEMORY ]
 浏览型号EDJ1108BABG-DG-E的Datasheet PDF文件第57页浏览型号EDJ1108BABG-DG-E的Datasheet PDF文件第58页浏览型号EDJ1108BABG-DG-E的Datasheet PDF文件第59页浏览型号EDJ1108BABG-DG-E的Datasheet PDF文件第60页浏览型号EDJ1108BABG-DG-E的Datasheet PDF文件第62页浏览型号EDJ1108BABG-DG-E的Datasheet PDF文件第63页浏览型号EDJ1108BABG-DG-E的Datasheet PDF文件第64页浏览型号EDJ1108BABG-DG-E的Datasheet PDF文件第65页  
EDJ1108BABG, EDJ1116BABG  
Clock Jitter [DDR3-1066, 800]  
-AC, -AE, -AG  
1066  
-8A, -8C  
800  
Data rate (Mbps)  
Parameter  
Symbol  
min.  
max.  
3333  
min.  
max.  
3333  
Unit  
ps  
Notes  
1
Average clock period  
tCK (avg)  
1875  
2500  
tCK(avg)min + tCK(avg)max+ tCK(avg)min + tCK(avg)max+  
Absolute clock period  
tCK (abs)  
tJIT (per)  
ps  
ps  
ps  
ps  
ps  
2
6
6
7
7
tJIT(per)min  
tJIT(per)max tJIT(per)min  
tJIT(per)max  
100  
Clock period jitter  
Clock period jitter during  
DLL locking period  
Cycle to cycle period jitter  
Cycle to cycle clock period jitter  
during DLL locking period  
90  
90  
100  
tJIT (per, lck) 80  
tJIT (cc)  
80  
90  
90  
180  
160  
200  
180  
tJIT (cc, lck)  
Cumulative error across 2 cycles  
Cumulative error across 3 cycles  
Cumulative error across 4 cycles  
Cumulative error across 5 cycles  
Cumulative error across 6 cycles  
Cumulative error across 7 cycles  
Cumulative error across 8 cycles  
Cumulative error across 9 cycles  
tERR (2per)  
tERR (3per)  
tERR (4per)  
tERR (5per)  
tERR (6per)  
tERR (7per)  
tERR (8per)  
tERR (9per)  
132  
132  
157  
175  
188  
200  
209  
217  
224  
231  
237  
242  
147  
175  
194  
209  
222  
232  
241  
249  
257  
263  
269  
147  
175  
194  
209  
222  
232  
241  
249  
257  
263  
269  
ps  
ps  
ps  
ps  
ps  
ps  
ps  
ps  
ps  
ps  
ps  
8
8
8
8
8
8
8
8
8
8
8
157  
175  
188  
200  
209  
217  
224  
Cumulative error across 10 cycles tERR (10per) 231  
Cumulative error across 11 cycles tERR (11per) 237  
Cumulative error across 12 cycles tERR (12per) 242  
Cumulative error across  
n=13, 14…49,50 cycles  
tERR (nper) min. = (1+0.68in(n)) x tJIT(per) min  
tERR (nper) max. = (1+0.68in(n)) x tJIT(per) max  
tERR (nper)  
tCH (avg)  
tCL (avg)  
tCH (abs)  
ps  
9
tCK  
(avg)  
tCK  
(avg)  
tCK  
(avg)  
tCK  
(avg)  
Average high pulse width  
0.47  
0.47  
0.43  
0.43  
0.53  
0.47  
0.47  
0.43  
0.43  
0.53  
3
Average low pulse width  
0.53  
0.53  
4
Absolute clock high pulse width  
10, 11  
Absolute clock low pulse width  
Duty cycle jitter  
tCL (abs)  
tJIT (duty)  
10, 12  
5
ps  
Notes: 1. tCK (avg) is calculated as the average clock period across any consecutive 200cycle window, where each  
clock period is calculated from rising edge to rising edge.  
N
tCK  
N
j
Σ
j = 1  
N = 200  
2. tCK (abs) is the absolute clock period, as measured from one rising edge to the next consecutive rising  
edge. tCK (abs) is not subject to production test.  
3. tCH (avg) is defined as the average high pulse width, as calculated across any consecutive 200 high  
pulses.  
N
(N × t  
)
tCH  
CK(avg)  
j
Σ
j = 1  
N = 200  
Data Sheet E1248E40 (Ver. 4.0)  
61  
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