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EDJ1108BABG-AC-E 参数 Datasheet PDF下载

EDJ1108BABG-AC-E图片预览
型号: EDJ1108BABG-AC-E
PDF下载: 下载PDF文件 查看货源
内容描述: 1G位DDR3 SDRAM [1G bits DDR3 SDRAM]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 148 页 / 1878 K
品牌: ELPIDA [ ELPIDA MEMORY ]
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EDJ1108BABG, EDJ1116BABG  
On-Die Termination (ODT) Levels and I-V Characteristics  
On-Die Termination effective resistance RTT is defined by bits A9, A6 and A2 of the MR1 Register.  
ODT is applied to the DQ, DM, DQS, /DQS and TDQS, /TDQS (×8 devices only) pins.  
A functional representation of the on-die termination is shown in the figure On-Die Termination: Definition of Voltages  
and Currents.  
The individual pull-up and pull-down resistors (RTTPu and RTTPd) are defined as follows:  
Parameter  
Symbol  
RTTPu  
Definition  
Conditions  
VDDQ VOUT  
IOUT  
ODT pull-up resistance  
RTTPd is turned off  
VOUT  
IOUT  
ODT pull-down resistance  
RTTPd  
RTTPu is turned off  
Chip in Termination Mode  
ODT  
VDDQ  
IPu  
IOut = IPd - IPu  
To  
other  
RTTPu  
circuitry  
like  
RCV,  
...  
DQ  
IOut  
RTTPd  
IPd  
VOut  
VSSQ  
On-Die Termination: Definition of Voltages and Currents  
The value of the termination resistor can be set via MRS command to RTT60 = RZQ/4 (nom) or RTT120 = RZQ/2  
(nom).  
RTT60 or RTT120 will be achieved by the DDR3 SDRAM after proper IO calibration has been performed.  
Tolerances requirements are referred to the ODT DC Electrical Characteristics table.  
Measurement Definition for RTT  
Apply VIH (AC) to pin under test and measure current I(VIH(AC)), then apply VIL(AC) to pin under test and measure  
current I(VIL(AC)) respectively.  
VIH(AC) VIL(AC)  
RTT =  
I(VIH(AC)) I(VIL(AC))  
Measurement Definition for VM  
Measure voltage (VM) at test pin (midpoint) with no load.  
2× VM  
VM =   
-1×100  
VDDQ  
Data Sheet E1248E40 (Ver. 4.0)  
26  
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