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EDE1104ACSE-5C-E 参数 Datasheet PDF下载

EDE1104ACSE-5C-E图片预览
型号: EDE1104ACSE-5C-E
PDF下载: 下载PDF文件 查看货源
内容描述: 1G位DDR2 SDRAM [1G bits DDR2 SDRAM]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 82 页 / 782 K
品牌: ELPIDA [ ELPIDA MEMORY ]
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EDE1104ACSE, EDE1108ACSE, EDE1116ACSE  
max.  
× 4  
× 8  
× 16  
Parameter  
Symbol Grade  
-8E  
Unit  
mA  
Test condition  
tCK = tCK (IDD);  
290  
280  
270  
290  
280  
270  
290  
280  
270  
Refresh command at every tRFC (IDD) interval;  
CKE is H, /CS is H between valid commands;  
Other control and address bus inputs are SWITCHING;  
Data bus inputs are SWITCHING  
Auto-refresh current IDD5  
-6E  
-5C  
Self-Refresh Mode;  
-8E  
-6E  
-5C  
10  
10  
10  
10  
10  
10  
10  
10  
10  
CK and /CK at 0V;  
CKE 0.2V;  
Other control and address bus inputs are FLOATING;  
Data bus inputs are FLOATING  
Self-refresh current  
IDD6  
IDD7  
mA  
mA  
all bank interleaving reads, IOUT = 0mA;  
BL = 4, CL = CL(IDD), AL = tRCD (IDD) 1 × tCK (IDD);  
tCK = tCK (IDD), tRC = tRC (IDD), tRRD = tRRD (IDD),  
tFAW = tFAW (IDD), tRCD = 1 × tCK (IDD);  
CKE is H, /CS is H between valid commands;  
Address bus inputs are STABLE during DESELECTs;  
Data pattern is same as IDD4W;  
-8E  
-6E  
-5C  
290  
275  
260  
290  
275  
260  
350  
310  
290  
Operating current  
(Bank interleaving)  
Notes: 1. IDD specifications are tested after the device is properly initialized.  
2. Input slew rate is specified by AC Input Test Condition.  
3. IDD parameters are specified with ODT disabled.  
4. Data bus consists of DQ, DM, DQS, /DQS, RDQS and /RDQS. IDD values must be met with all  
combinations of EMRS bits 10 and 11.  
5. Definitions for IDD  
L is defined as VIN VIL (AC) (max.)  
H is defined as VIN VIH (AC) (min.)  
STABLE is defined as inputs stable at an H or L level  
FLOATING is defined as inputs at VREF = VDDQ/2  
SWITCHING is defined as:  
inputs changing between H and L every other clock cycle (once per two clocks) for address and control  
signals, and inputs changing between H and L every other data transfer (once per clock) for DQ signals  
not including masks or strobes.  
6. Refer to AC Timing for IDD Test Conditions.  
Data Sheet E0975E50 (Ver.5.0)  
9