EBE41AE4ABHA
Parameter
Symbol Grade
IDD5
max
Unit
mA
Test condition
tCK = tCK (IDD);
Refresh command at every tRFC (IDD) interval;
CKE is H, /CS is H between valid commands;
Other control and address bus inputs are SWITCHING;
Data bus inputs are SWITCHING
Auto-refresh current
8200
Self Refresh Mode;
CK and /CK at 0V;
Self-refresh current
IDD6
IDD7
550
mA
mA
CKE ≤ 0.2V;
Other control and address bus inputs are FLOATING;
Data bus inputs are FLOATING
all bank interleaving reads, IOUT = 0mA;
BL = 4, CL = CL(IDD), AL = tRCD (IDD) −1 × tCK(IDD);
tCK = tCK (IDD), tRC = tRC (IDD), tRRD = tRRD (IDD),
tFAW = tFAW (IDD), tRCD = 1 × tCK (IDD);
CKE is H, /CS is H between valid commands;
Address bus inputs are STABLE during DESELECTs;
Data pattern is same as IDD4W;
Operating current
(Bank interleaving)
8200
Notes: 1. IDD specifications are tested after the device is properly initialized.
2. Input slew rate is specified by AC Input Test Condition.
3. IDD parameters are specified with ODT disabled.
4. Data bus consists of DQ, DM, DQS, /DQS, RDQS and /RDQS. IDD values must be met with all
combinations of EMRS bits 10 and 11.
5. Definitions for IDD
L is defined as VIN ≤ VIL (AC) (max.)
H is defined as VIN ≥ VIH (AC) (min.)
STABLE is defined as inputs stable at an H or L level
FLOATING is defined as inputs at VREF = VDDQ/2
SWITCHING is defined as:
inputs changing between H and L every other clock cycle (once per two clocks) for address and control
signals, and inputs changing between H and L every other data transfer (once per clock) for DQ signals
not including masks or strobes.
6. Refer to AC Timing for IDD Test Conditions.
AC Timing for IDD Test Conditions
For purposes of IDD testing, the following parameters are to be utilized.
DDR2-667
Parameter
5-5-5
5
Unit
tCK
ns
CL (IDD)
tRCD (IDD)
tRC (IDD)
15
60
ns
tRRD (IDD)
tFAW (IDD)
tCK (IDD)
7.5
37.5
3
ns
ns
ns
tRAS (min.)(IDD)
tRAS (max.)(IDD)
tRP (IDD)
45
ns
70000
15
ns
ns
tRFC (IDD)
127.5
ns
Data Sheet E0901E20 (Ver. 2.0)
13