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PALCE16V8-15JC 参数 Datasheet PDF下载

PALCE16V8-15JC图片预览
型号: PALCE16V8-15JC
PDF下载: 下载PDF文件 查看货源
内容描述: 闪存擦除可再编程的CMOS PAL器件 [Flash-Erasable Reprogrammable CMOS PAL Device]
分类和应用: 闪存可编程逻辑器件输入元件时钟
文件页数/大小: 13 页 / 300 K
品牌: CYPRESS [ CYPRESS SEMICONDUCTOR ]
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USE ULTRA37000™ FOR
ALL NEW DESIGNS
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12) ........................................... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High-Z State ............................................... –0.5V to +7.0V
PALCE16V8
DC Input Voltage ............................................–0.5V to +7.0V
Output Current into Outputs (LOW)............................. 24 mA
DC Programming Voltage............................................. 12.5V
Latch-Up Current .................................................... > 200 mA
Operating Range
Range
Commercial
Military
[1]
Industrial
Ambient Temperature
0
°
C to +75
°
C
–55
°
C to +125
°
C
–40
°
C to +85
°
C
V
CC
5V
±5%
5V
±10%
5V
±10%
Electrical Characteristics
Over the Operating Range
[2]
Parameter
V
OH
V
OL
V
IH
V
IL[4]
I
IH
I
IL[5]
I
SC
I
CC
Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Level
Input LOW Level
Input or I/O HIGH Leakage
Current
Input or I/O LOW Leakage
Current
Operating Power Supply
Current
V
CC
= Min.,
V
IN
= V
IH
or V
IL
V
CC
= Min.,
V
IN
= V
IH
or V
IL
Test Conditions
I
OH
= –3.2 mA
I
OH
= –2 mA
I
OL
= 24 mA
I
OL
= 12 mA
Com’l
Mil/Ind
Com’l
Mil/Ind
2.0
–0.5
0.8
10
–100
–30
Com’l
–150
115
90
55
Mil/Ind
Mil.
Ind.
130
65
65
V
V
µA
µA
mA
mA
mA
mA
mA
mA
mA
Inputs
[3]
0.5
V
Min.
2.4
Max.
Unit
V
Guaranteed Input Logical HIGH Voltage for All Inputs
[3]
Guaranteed Input Logical LOW Voltage for All
3.5V < V
IN
< V
CC
0V < V
IN
< V
IN
(Max.)
Output Short Circuit Current V
CC
= Max., V
OUT
= 0.5V
[6, 7]
V
CC
= Max.,
V
IL
= 0V, V
IH
= 3V,
Output Open,
f = 15 MHz
(counter)
5, 7 ns
10, 15, 25 ns
15L, 25L ns
10, 15, 25 ns
15L, 25L ns
15L, 25L ns
Capacitance
[7]
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
V
IN
= 2.0V @ f = 1 MHz
V
OUT
= 2.0V @ f = 1 MHz
Typ.
5
5
Unit
pF
pF
Endurance Characteristics
[7]
Parameter
N
Description
Minimum Reprogramming Cycles
Test Conditions
Normal Programming Conditions
Min.
100
Max.
Unit
Cycles
Notes:
1. T
A
is the “instant on” case temperature.
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. V
IL
(Min.) is equal to –3.0V for pulse durations less than 20 ns.
5. The leakage current is due to the internal pull-up resistor on all pins.
6. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V
OUT
= 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
7. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-03025 Rev. *A
Page 4 of 13