欢迎访问ic37.com |
会员登录 免费注册
发布采购

PALC22V10-25WC 参数 Datasheet PDF下载

PALC22V10-25WC图片预览
型号: PALC22V10-25WC
PDF下载: 下载PDF文件 查看货源
内容描述: 闪存擦除可再编程的CMOS PAL器件 [Flash-erasable Reprogrammable CMOS PAL Device]
分类和应用: 闪存
文件页数/大小: 13 页 / 350 K
品牌: CYPRESS [ CYPRESS SEMICONDUCTOR ]
 浏览型号PALC22V10-25WC的Datasheet PDF文件第1页浏览型号PALC22V10-25WC的Datasheet PDF文件第2页浏览型号PALC22V10-25WC的Datasheet PDF文件第3页浏览型号PALC22V10-25WC的Datasheet PDF文件第4页浏览型号PALC22V10-25WC的Datasheet PDF文件第6页浏览型号PALC22V10-25WC的Datasheet PDF文件第7页浏览型号PALC22V10-25WC的Datasheet PDF文件第8页浏览型号PALC22V10-25WC的Datasheet PDF文件第9页  
USE ULTRA37000
TM
FOR
ALL NEW DESIGNS
AC Test Loads and Waveforms
5V
OUTPUT
CL
INCLUDING
JIG AND
SCOPE
(a)
3.0V
GND
< 2 ns
R2170Ω
(236Ω MIL)
INCLUDING
JIG AND
SCOPE
(b)
ALL INPUT PULSES
90%
10%
90%
10%
< 2 ns
(d)
Equivalent to:THÉVENIN Equivalent (Commercial)
99Ω
OUTPUT
2.08V = V
THC
OUTPUT
R1238Ω
(319Ω MIL)
5V
OUTPUT
5 pF
R1238Ω
(319Ω MIL)
OUTPUT
PALCE22V10
R2170Ω
(236Ω MIL)
CL
750Ω
(1.2KΩ
MIL)
(c)
Equivalent to: THÉVENIN Equivalent (Military)
136Ω
2.13V = V
THM
Load Speed
5, 7.5, 10, 15, 25 ns
C
L
50 pF
Parameter
t
ER (-
)
Package
PDIP, CDIP,
PLCC, LCC
V
X
1.5V
2.6V
0V
V
thc
V
OH
V
OL
V
X
V
X
Output W
aveform Measurement Level
0.5V
0.5V
1.5V
V
X
V
X
V
OH
t
ER (+)
t
EA
t
EA
(+)
(- )
0.5V
(e) Test Waveforms
V
OL
Commercial Switching Characteristics PALCE22V10
22V10-5
Parameter
t
PD
t
EA
t
ER
t
CO
Description
Input to Output
Propagation Delay
[8]
Input to Output Enable Delay
[9]
Input to Output Disable Delay
[10]
Clock to Output Delay
[8]
2
Min.
3
Max.
5
6
6
4
2
Min.
3
[2, 7]
22V10-7
Max.
7.5
8
8
5
22V10-10
Min.
3
Max.
10
10
10
2
7
22V10-15
Min.
3
Max.
15
15
15
2
8
22V10-25
Min.
3
Max.
25
25
25
2
15
Unit
ns
ns
ns
ns
Notes:
7. Part (a) of AC Test Loads and Waveforms is used for all parameters except t
ER
and t
EA(+)
. Part (b) of AC Test Loads and Waveforms is used for t
ER
. Part (c) of AC Test
Loads and Waveforms is used for t
EA(+)
.
8. Min. times are tested initially and after any design or process changes that may affect these parameters.
9. The test load of (a) of AC Test Loads and Waveforms is used for measuring t
EA(-)
. The test load of (c) of AC Test Loads and Waveforms is used for measuring t
EA(+)
only.
Please see (e) of AC Test Loads and Waveforms for enable and disable test waveforms and measurement reference levels.
10. This parameter is measured as the time after output disable input that the previous output data state remains stable on the output. This delay is measured to
the point at which a previous HIGH level has fallen to 0.5V below V
OH
min. or a previous LOW level has risen to 0.5V above V
OL
max. Please see (e) of AC Test Loads
and Waveforms for enable and disable test waveforms and measurement reference levels.
Document #: 38-03027 Rev. *B
Page 5 of 13