CY7C185
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage to Ground Potential ............... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State
[2]
............................................ –0.5V to +7.0V
DC Input Voltage
[2]
......................................... –0.5V to +7.0V
Output Current into Outputs (LOW)............................. 20 mA
Static Discharge Voltage........................................... >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current .................................................... >200 mA
Operating Range
Range
Commercial
Industrial
Ambient
Temperature
0
°
C to +70
°
C
–40
°
C to +85
°
C
V
CC
5V
±
10%
5V
±
10%
Electrical Characteristics
Over the Operating Range
–15
Parameter
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
CC
I
SB1
Description
Output HIGH
Voltage
Output LOW
Voltage
Input HIGH
Voltage
Input LOW
Voltage
[2]
Input Leakage
Current
GND
≤
V
I
≤
V
CC
Test Conditions
V
CC
= Min.,
I
OH
= –4.0 mA
V
CC
= Min.,
I
OL
= 8.0 mA
2.2
–0.5
–5
–5
Min.
2.4
0.4
V
CC
+ 0.3V
0.8
+5
+5
130
40
2.2
–0.5
–5
–5
Max.
Min.
2.4
0.4
V
CC
+ 0.3V
0.8
+5
+5
110
20
2.2
–0.5
–5
–5
–20
Max.
2.4
0.4
V
CC
+ 0.3V
0.8
+5
+5
100
20
–25, -35
Min.
Max.
Unit
V
V
V
V
µA
µA
mA
mA
Output Leakage GND
≤
V
I
≤
V
CC
,
Current
Output Disabled
V
CC
Operating V
CC
= Max.,
Supply Current I
OUT
= 0 mA
Automatic
Power-Down
Current
Automatic
Power-Down
Current
Max. V
CC
,
CE
1
≥
V
IH
or CE
2
≤
V
IL
Min. Duty Cycle =100%
Max. V
CC
,
CE
1
≥
V
CC
– 0.3V,
or CE
2
≤
0.3V
V
IN
≥
V
CC
– 0.3V or
V
IN
≤
0.3V
I
SB2
15
15
15
mA
Capacitance
[3]
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
T
A
= 25°C, f = 1 MHz,
V
CC
= 5.0V
Max.
7
7
Unit
pF
pF
Notes:
2. Minimum voltage is equal to –3.0V for pulse durations less than 30 ns.
3. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-05043 Rev. *B
Page 2 of 12
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