Crane Aerospace & Electronics Power Solutions
sLH sꢂꢄglꢃ ꢀꢄꢆ dꢇꢀl dc/dc cꢈꢄvꢃꢉꢊꢃꢉꢁ
28 VoLt input – 1.5 Watt – pendinꢋ reVision c reLease
Cl a s s
H
a n d K, MIl-PRF-38534 El E M E n t
Ev a l u a t I o n
COmpOnent-level test
perfOrmed
spaCe prOtOtype (O)
nOn-Qml1
Class h
Qml
Class K
Qml
m/s2
yes
p3
no
no
m/s2
p3
yes
yes
m/s2
yes
p3
yes
yes
Element Electrical
Element Visual
yes
yes
no
yes
Internal Visual
no
no
no
no
no
no
no
N/A
no
no
no
no
no
N/A
no
yes
no
N/A
no
yes
yes
yes
yes
yes
yes
yes
N/A
N/A
yes
yes
yes
no
N/A
yes
yes
N/A
N/A
N/A
N/A
yes
yes
yes
yes
N/A
yes
Temperature Cycling
Constant Acceleration
Interim Electrical
Burn-in
no
no
no
N/A
N/A
N/A
N/A
no
no
N/A
N/A
N/A
N/A
no
no
Post Burn-in Electrical
Steady State Life
Voltage Conditioning Aging
Visual Inspection
Final Electrical
no
no
N/A
N/A
yes
yes
no
no
no
no
yes
yes
N/A
yes
4
Wire Bond Evaluation
no
SEM
N/A
no
SLAM™/C-SAM:
no
Input capacitors only
(Add’l test, not req. by H or K)
Notes:
1. Non-QML products do not meet all of the requirements of MIL-PRF-38534.
2. M/S = Active components (Microcircuit and Semiconductor Die)
3. P = Passive components
4. Not applicable to EMI filters that have no wirebonds.
Definitions:
Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534
SEM: Scanning Electron Microscopy
SLAM™: Scanning Laser Acoustic Microscopy
C-SAM: C - Mode Scanning Acoustic Microscopy
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