Crane Aerospace & Electronics Power Solutions
sFMc28-461 eMi iꢀꢁuꢂ Fꢃlꢂꢄꢅꢆ
28 Voꢇt inpꢈt – 2.7 AMp
claSS H and k, mil-prF-38534 element evaluation
Space
teSt perFormed
prototype o
claSS H
claSS k
1
non-Qml
Qml
2
Qml
2
2
3
3
3
(component level)
Element Electrical
Element Visual
m/S
p
m/S
p
m/S
p
yes
no
no
no
no
no
no
no
no
N/A
no
no
no
no
no
no
yes
yes
yes
no
yes
yes
N/A
no
yes
yes
yes
yes
yes
yes
yes
yes
yes
N/A
N/A
yes
yes
yes
yes
yes
N/A
yes
yes
N/A
N/A
N/A
N/A
yes
yes
yes
yes
N/A
Internal Visual
N/A
no
Temperature Cycling
Constant Acceleration
Interim Electrical
Burn-in
no
no
no
N/A
N/A
N/A
N/A
no
no
N/A
N/A
N/A
N/A
no
no
Post Burn-in Electrical
Steady State Life
Voltage Conditioning Aging
Visual Inspection
Final Electrical
no
no
N/A
N/A
yes
yes
no
no
no
no
yes
yes
N/A
4
Wire Bond Evaluation
no
SEM
N/A
SLAM™/C-SAM:
Input capacitors only
(Add’l test, not req. by H or K)
no
no
no
yes
no
yes
Notes:
1. Non-QML products do not meet all of the requirements of MIL-PRF-38534.
2. M/S = Active components (Microcircuit and Semiconductor Die)
3. P = Passive components
4. Not applicable to EMI filters that have no wirebonds.
Definitions:
Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534
SEM: Scanning Electron Microscopy
SLAM™: Scanning Laser Acoustic Microscopy
C-SAM: C - Mode Scanning Acoustic Microscopy
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