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SPT7851SIT 参数 Datasheet PDF下载

SPT7851SIT图片预览
型号: SPT7851SIT
PDF下载: 下载PDF文件 查看货源
内容描述: 10位, 20 MSPS, 79mW模拟数字转换器 [10-Bit, 20 MSPS, 79mW Analog-to-DIgital Converter]
分类和应用: 转换器
文件页数/大小: 9 页 / 177 K
品牌: CADEKA [ CADEKA MICROCIRCUITS LLC. ]
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SPT7851
DATA SHEET
Electrical Specifications
(
T
A
= T
MIN
–T
MAX
, V
DD1
= V
DD2
= V
DD3
= 3.3V, V
REF–
= 1.0V, V
REF+
= 2.0V, Common Mode Voltage = 1.65V,
ƒ
CLK
= 20 MSPS,
Bias1 = 90
µ
A, Bias2 = 9.5
µ
A, Differential Input, Duty Cycle = 50%; unless otherwise noted)
Parameter
Digital Inputs
Logic 1 Voltage
Logic 0 Voltage
Maximum Input Current Low
Maximum Input Current High
Input Capacitance
Digital Outputs
Logic 1 Voltage
Logic 0 Voltage
CLK to Output Delay Time (t
D
)
Power Supply Requirements
Supply Voltage (V
DD1
, V
DD2
, V
DD3
)
Supply Current (I
DD
)
Power Dissipation
Power Supply Rejection Ratio
TEST LEVEL CODES
All electrical characteristics are subject to the following conditions:
All parameters having min/max specifications are guaranteed. The Test Level column indicates the specific device testing
actually performed during production and Quality Assurance inspection.
LEVEL
IV
V
VI
TEST PROCEDURE
Parameter is guaranteed (but not tested) by design or characterization data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25°C. Parameter is guaranteed over specified temperature range.
IV
VI
VI
V
2.8
3.3
24
79
67
3.6
30
100
V
mA
mW
dB
I
O
= -2mA
I
O
= +2mA
VI
VI
IV
4
85%
V
DD
90%
V
DD
0.1
8
0.4
12
V
V
ns
V
IN
= GND
V
IN
= V
DD
VI
VI
VI
VI
V
1.8
80%
V
DD
20%
V
DD
±1
±1
µ
A
µ
A
pF
Conditions
Test Level
Min
Typ
Max Units
Absolute Maximum Ratings
(beyond which the device may be damaged)
Parameter
Supply Voltages
V
DD1
, V
DD2
,V
DD3
Input Voltages
Analog and Digital Input
V
REF+
, V
REF–
, CLK
Operating Temperature Range
Storage Temperature Range
-0.5
-0.5
-40
-65
V
DD
+0.5
V
DD
+0.5
+85
+125
V
V
°C
°C
-0.5
+6
V
Min
Max
Units
Note:
1. Operation at any Absolute Maximum Rating is not implied.
See Electrical Specifications for proper nominal applied conditions in typical applications.
REV. 1B October 2003
3