ELECTRICAL SPECIFICATIONS
T
A
= T
MIN
to T
MAX
, V
EE
= 0 to +5 V, V
DD
= +5 V, f
S
= 117 kHz, f
IN
= 10 kHz, unless otherwise specified.
PARAMETER
TEST
CONDITIONS
TEST
LEVEL
SPT774C
MIN
TYP
MAX
SPT774B
MIN
TYP
MAX
UNITS
AC ELECTRICAL CHARACTERISTICS
4
Stand-Alone Mode Timing
t
HRL
Low R/C Pulse Width
t
DS
STS Delay from R/C
t
HDR
Data Valid After R/C Low
t
HS
STS Delay After Data Valid
t
HRH
High R/C Pulse Width
t
DDR
Data Access Time
Sample-and-Hold
Aperture Delay
Aperture Uncertainty Time
VI
VI
VI
VI
VI
VI
V
EE
= +5 V
V
EE
= +5 V
IV
V
25
75
100
150
25
200
375
150
20
300
20
300
25
75
100
150
25
200
375
150
ns
ns
ns
ns
ns
ns
ns
ps, RMS
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
=25
°C,
and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at T
A
= 25
°C.
Parameter is
guaranteed over specified temperature range.
Figure 3 - Low Pulse for R/C - Outputs Enabled
After Conversion
t
R/C
HRL
Figure 4 - High Pulse for R/C - Outputs Enabled While
R/C is High, Otherwise High Impedance
R/C
t
HRH
t
DS
t
DS
STS
t
t
t
C
STS
t
t
HDR
C
t HS
DB11-DB0
HIGH-Z
DDR
HDR
HIGH-Z
DATA VALID
DB11-DB0
DATA VALID
DATA VALID
SPT774
5
8/1/00
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
