AZP51
AZP52
AZP53
AZP54
Absolute Maximum Ratings are those values beyond which device life may be impaired.
Symbol
Characteristic
Rating
Unit
VDD
VI
TA
Power Supply
Input Voltage
Operating Temperature Range
Storage Temperature Range
0 to +5.5
-0.5 to VDD+0.5
-40 to +85
Vdc
Vdc
°C
TSTG
-65 to +150
°C
DC Characteristics (VDD = 3.0V to 3.6V unless otherwise specified, TA = -40 to 85 C)
Symbol
Characteristic
Conditions
Min
Typ
Max
Unit
-40 C
25 C
85 C
-40 C
25 C
85 C
2.05
2.05
2.05
1.365
1.430
1.490
2.415
2.480
2.540
1.615
1.680
1.740
VOH
VOL
Output HIGH Voltage1
VDD = 3.3V
V
Output LOW Voltage1
VDD = 3.3V
V
Output Leakage Current, Tri-
state2
High Level Input Voltage
IZ
EN=Disable3
-10
2.0
10
μA
V
VIH
VIL
EN_SEL4
DIV_SEL4
EN
EN_SEL
DIV_SEL
EN
Low Level Input Voltage
0.8
V
RPU
RPD
RP
Pullup Resistor4
50k
50k
50k
Ω
Ω
Ω
Pulldown Resistor4
Pullup/Pulldown Resistor5
D Input to Internal
VDD/2 Reference
RBIAS
IDD
Bias Resistor
10k
Ω
Power Supply Current
22
35
mA
1.
2.
3.
4.
5.
Specified with outputs terminated through 50Ω resistors to VDD - 2V or Thevenin equivalent.
Measured at Q/Q¯ pins.
See functional tables for Disable state definition.
AZP53 only.
See functional operation table for pullup/pulldown mode selection.
AC Characteristics (VDD = 3.0V to 3.6V, TA = -40 to 85 C)
Symbol
tr / tf
fMAX
tpd
Characteristic
Unit
Min
Max
Output Rise/Fall1
(20% - 80%)
0.25
0.7
ns
Maximum Input
Frequency – Sine wave2
Propagation Delay1,3,6
D to Q/Q¯
650
3.0
MHz
ns
1.0
Enable1,4
ten
200
80
ns
EN to Q/Q¯
Disable1,5
tdis
ns
EN to Q/Q¯
Phase Noise1,3
10 MHz offset
dBc/
Hz
nP
-158
1.
2.
3.
4.
5.
6.
Specified with outputs terminated through 50Ω resistors to VCC - 2V or Thevenin equivalent.
750 mv p-p sine wave, AC coupled to D input.
155 MHz 750 mv p-p sine wave input.
EN asserted (enabled) to Q/Q¯ outputs producing specified VOH & VOL levels.
EN deasserted (disabled) to Q/Q¯ outputs ≤ VOL min.
Measured from 50% D to 50% Q/Q¯.
December 2009 * REV - 2
www.azmicrotek.com
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