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ATMEGA2560 参数 Datasheet PDF下载

ATMEGA2560图片预览
型号: ATMEGA2560
PDF下载: 下载PDF文件 查看货源
内容描述: 8位微控制器与256K字节的系统内可编程闪存 [8- BIT Microcontroller with 256K Bytes In-System Programmable Flash]
分类和应用: 闪存微控制器
文件页数/大小: 407 页 / 2985 K
品牌: ATMEL [ ATMEL ]
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state. The Exit-IR, Pause-IR, and Exit2-IR states are only used for navigating the  
state machine.  
At the TMS input, apply the sequence 1, 0, 0 at the rising edges of TCK to enter the  
Shift Data Register – Shift-DR state. While in this state, upload the selected Data  
Register (selected by the present JTAG instruction in the JTAG Instruction Register)  
from the TDI input at the rising edge of TCK. In order to remain in the Shift-DR state,  
the TMS input must be held low during input of all bits except the MSB. The MSB of  
the data is shifted in when this state is left by setting TMS high. While the Data  
Register is shifted in from the TDI pin, the parallel inputs to the Data Register  
captured in the Capture-DR state is shifted out on the TDO pin.  
Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. If the selected  
Data Register has a latched parallel-output, the latching takes place in the Update-  
DR state. The Exit-DR, Pause-DR, and Exit2-DR states are only used for navigating  
the state machine.  
As shown in the state diagram, the Run-Test/Idle state need not be entered between  
selecting JTAG instruction and using Data Registers, and some JTAG instructions may  
select certain functions to be performed in the Run-Test/Idle, making it unsuitable as an  
Idle state.  
Note:  
Independent of the initial state of the TAP Controller, the Test-Logic-Reset state can  
always be entered by holding TMS high for five TCK clock periods.  
For detailed information on the JTAG specification, refer to the literature listed in “Bibli-  
ography” on page 300.  
Using the Boundary-  
scan Chain  
A complete description of the Boundary-scan capabilities are given in the section “IEEE  
1149.1 (JTAG) Boundary-scan” on page 301.  
Using the On-chip Debug As shown in Figure 129, the hardware support for On-chip Debugging consists mainly of  
System  
A scan chain on the interface between the internal AVR CPU and the internal  
peripheral units.  
Break Point unit.  
Communication interface between the CPU and JTAG system.  
All read or modify/write operations needed for implementing the Debugger are done by  
applying AVR instructions via the internal AVR CPU Scan Chain. The CPU sends the  
result to an I/O memory mapped location which is part of the communication interface  
between the CPU and the JTAG system.  
The Break Point Unit implements Break on Change of Program Flow, Single Step  
Break, two Program Memory Break Points, and two combined Break Points. Together,  
the four Break Points can be configured as either:  
4 single Program Memory Break Points.  
3 Single Program Memory Break Point + 1 single Data Memory Break Point.  
2 single Program Memory Break Points + 2 single Data Memory Break Points.  
2 single Program Memory Break Points + 1 Program Memory Break Point with mask  
(“range Break Point”).  
2 single Program Memory Break Points + 1 Data Memory Break Point with mask  
(“range Break Point”).  
A debugger, like the AVR Studio, may however use one or more of these resources for  
its internal purpose, leaving less flexibility to the end-user.  
298  
ATmega640/1280/1281/2560/2561  
2549A–AVR–03/05  
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