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PEEL18CV8ZJI-25 参数 Datasheet PDF下载

PEEL18CV8ZJI-25图片预览
型号: PEEL18CV8ZJI-25
PDF下载: 下载PDF文件 查看货源
内容描述: CMOS可编程电可擦除逻辑器件 [CMOS Programmable Electrically Erasable Logic Device]
分类和应用: 可编程逻辑输入元件时钟
文件页数/大小: 10 页 / 442 K
品牌: ANACHIP [ ANACHIP CORP ]
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-25 / I-25  
Symbol  
Parameter  
Input5 to non-registered output  
Units  
Min  
Max  
25  
25  
tPD  
tOE  
tOD  
ns  
ns  
ns  
Input5 to output enable6  
Input5 to output disable6  
25  
tCO1  
tCO2  
tCF  
tSC  
tHC  
tCL, tCH  
tCP  
fMAX1  
fMAX2  
fMAX3  
tAW  
Clock to Output  
15  
35  
9
ns  
ns  
ns  
ns  
ns  
ns  
ns  
MHz  
MHz  
MHz  
ns  
ns  
ns  
Clock to comb. output delay via internal registered feedback  
Clock to Feedback  
Input5 or feedback setup to clock  
Input5 hold after clock  
15  
0
13  
Clock low time, clock high time8  
Min clock period Ext (tSC + tCO1  
Internal feedback (1/tSC + tCF)11  
External feedback (1/tCP)11  
No feedback (1/tCL + tCH)11  
)
30  
41.6  
33.3  
38.4  
25  
Asynchronous Reset Pulse Width  
tAP  
tAR  
tRESET  
Input5 to Asynchronous Reset  
25  
25  
5
Asynchronous Reset recovery time  
Power-on reset time for registers in clear state12  
µs  
Switching Waveforms  
Inputs, I/O,  
Registered Feedback,  
Synchronous Preset  
Clock  
Asynchronous  
Reset  
Registered  
Outputs  
Combinatorial  
Outputs  
Notes:  
1. Minimum DC input is -0.5V, however, inputs may undershoot to -2.0V for peri-  
ods less than 20 ns.  
8. Test conditions assume: signal transition times of 3ns or less from the 10% and  
90% points, timing reference levels of 1.5V (Unless otherwise specified).  
9. Test one output at a time for a duration of less than 1 second.  
10. ICC for a typical application: This parameter is tested with the device pro-  
grammed as an 8-bit Counter.  
2. VI and VO are not specified for program/verify operation.  
3. Test Points for Clock and VCC in t  
R and tF are referenced at the 10% and 90%  
levels.  
4. I/O pins are 0V and VCC  
.
11. Parameters are not 100% tested. Specifications are based on initial character-  
ization and are tested after any design process modification that might affect oper-  
ational frequency.  
5. “Input” refers to an input pin signal.  
6. tOE is measured from input transition to VREF±0.1V,  
TOD is measured from input transition to VOH-0.1V or VOL+0.1V; VREF=VL.  
12. All input at GND.  
7. Capacitances are tested on a sample basis.  
Anachip Corp.  
www.anachip.com.tw  
Rev. 1.0 Dec 16, 2004  
8/10  
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