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AS1123-BTST 参数 Datasheet PDF下载

AS1123-BTST图片预览
型号: AS1123-BTST
PDF下载: 下载PDF文件 查看货源
内容描述: 恒-cur租金, 16 -Channe升LED医生艾弗的Wi日DIAGNOST集成电路 [Constant -Cur rent , 16 -Channe l LED Dr iver wi th Diagnost ics]
分类和应用:
文件页数/大小: 25 页 / 2230 K
品牌: AMSCO [ AMS(艾迈斯) ]
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AS1123  
Datasheet ꢀ Detailed Description  
Detailed Shorted-LED Error Report  
The detailed shortedꢀLED error report can be read out immediately after global error mode has been run (see Global Error Mode on page 10).  
SDI must be 1 for the first device.  
Figure 16. Detailed Shorted-LED Error Report Timing Diagram  
Global Flag Readout  
Detailed Error Report Readout  
OEN  
LD  
tTESTING  
tSU(ERROR)  
tH(L)  
tP4  
tGSW(ERROR)  
tGSW(ERROR)  
CLK  
tGSW(ERROR)  
Don’t  
Care  
DBit15  
DBit14 DBit13 DBit12 DBitn DBit2 DBit1 DBit0  
SDI  
tSW(ERROR)  
SFLAG  
New ata Input  
Don’t  
Care  
SBit15 SBit14 13 it12 SBitn SBit2 SSB
O
FLAG  
T
FLAG  
T
SDO  
edED Error Report put  
tP4  
tP1  
For detailed timing information see Timing Diagrams on page 8.  
Detailed ShortedꢀLED Error Report Example  
Consider a case where three AS1123s are cascaded in onchain. A 1 indicates a LED ona 0 indicates a LED is off, and an X indicates a  
shorted LED. This test is used onꢀtheꢀfly.  
IC1:[11111XX111111111] IC2:[1111111111111111] IC3X100011111111111]  
IC1 has two shorted LEDs which are switched C3 has one shorted LED witched off due to input. 3*16 clock cycles are needed to write the  
entire error code out. The detailed error report ould look like this:  
1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 0 1 0 0 0 1 1 1 1 1 1 1 1 1 1 1  
1 1 1 1 1 X X 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 X 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1  
1 1 1 1 1 0 0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1  
Input Data:  
LED Status:  
Failure Code:  
Showing IC1 as the device with two shorted LEDs osition 6 and 7, and IC3 with one shorted LED at position 1. The shorted LED at position 1  
of IC3 cannot be detected, since LEDs tuned off at test time are not tested and will show a logic "1" at the detailed error report. To test all LEDs  
this test should be run with an all 1s test ptternFor a test with an all on test pattern, lowꢀcurrent diagnostic mode should be entered first to  
reduce onꢀscreen flickering.  
Note: In an actual report the are no spaces in the output. LEDs turned off during test time cannot be tested and will show a logic 1 in the  
detailed error report.  
Low-Current Diagnotic Mode  
To run the openꢀ or shortedꢀLED test, a test pattern must be used that will turn on each LED to be tested. This test pattern will cause a short  
flicker on the scren wile the test is being performed. The lowꢀcurrent diagnostic mode can be initiated prior to running a detailed error report to  
reduce thꢀscreen flickering.  
Nte: Normally, displays using such a diagnostic mode require additional cables, resistors, and other components to reduce the current. The  
AS1123 has this currentꢀreduction capability builtꢀin, thereby minimizing the number of external components required.  
Lowꢀcurrent diagnostic mode can be initiated via 3 clock pulses during errorꢀdetection mode. After the falling edge of LD, a test pattern displaying  
all 1s can be written to the shift register which will be used for the next errorꢀdetection test.  
On the next falling edge of OEN, current is reduced to ILC. With the next rising edge of OEN the current will immediately increase to normal levꢀ  
els and the detailed error report can be read out entering errorꢀdetection mode.  
www.austriamicrosystems.com/LEDꢀDriverꢀICs  
Revision 1.00  
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