AMD
ENDURANCE CHARACTERISTICS
The PALCE16V8 is manufactured using AMD’s ad-
vanced Electrically Erasable process. This technology
uses an EE cell to replace the fuse link used in bipolar
parts. As a result, the device can be erased and
reprogrammed—a feature which allows 100% testing at
the factory.
Symbol Parameter
tDR Min Pattern Data Retention Time
Test Conditions
Min
Unit
Max Storage Temperature
10
20
Years
Years
Cycles
Max Operating Temperature
Normal Programming Conditions
N
Min Reprogramming Cycles
100
2-58
PALCE16V8 Family