ENDURANCE CHARACTERISTICS
The MACH families are manufactured using AMD’s ad-
vanced Electrically Erasable process. This technology
uses an EE cell to replace the fuse link used in bipolar
parts. As a result, the device can be erased and repro-
grammed, a feature which allows 100% testing at the
factory.
Endurance Characteristics
Parameter
Symbol
Parameter Description
Min Pattern Data Retention Time
Max Reprogramming Cycles
Min
10
Units
Years
Years
Cycles
Test Conditions
Max Storage Temperature
Max Operating Temperature
Normal Programming Conditions
t
DR
20
N
100
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