SWITCHING CHARACTERISTICS: BUS INTERFACE (CONTINUED)
Parameter
Symbol
Parameter Name
Test Condition
Min
Max
Unit
kHz
EEPROM Timing
fEESK
EESK Frequency
(Note 2)
650
tHIGH (EESK) EESK High Time
tLOW (EESK) EESK Low Time
780
780
-15
-15
ns
ns
ns
ns
ns
ns
ns
tVAL (EEDI)
tVAL (EECS)
EEDI Valid Output Delay from EESK (Note 2)
EECS Valid Output Delay from EESK (Note 2)
15
15
tLOW (EECS) EECS Low Time
1550
50
tSU (EEDO)
tH (EEDO)
EEDO Setup Time to EESK
EEDO Hold Time from EESK
(Note 2)
(Note 2)
0
JTAG (IEEE 1149.1) Test Signal Timing
tJ1
TCK Frequency
10
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
tJ2
TCK Period
100
45
tJ3
TCK High Time
@ 2.0 V
@ 0.8 V
tJ4
TCK Low Time
45
tJ5
TCK Rise Time
4
4
tJ6
TCK Fall Time
tJ7
TDI, TMS Setup Time
TDI, TMS Hold Time
TDO Valid Delay
8
tJ8
10
3
tJ9
30
50
25
36
tJ10
tJ11
tJ12
tJ13
tJ14
TDO Float Delay
All Outputs (Non-Test) Valid Delay
All Outputs (Non-Test) Float Delay
All Inputs (Non-Test)) Setup Time
All Inputs (Non-Test) Hold Time
3
8
7
Notes:
1. Not tested; parameter guaranteed by design characterization.
2. Parameter value is given for automatic EEPROM read operation. When EEPROM port (BCR19) is used to access the EE-
PROM, software is responsible for meeting EEPROM timing requirements.
Am79C978
223
AMD [ AMD ]
